The scope of the EM'2005 is to provide an overview of present achievements in electron microscopy and to highlight recent applications in physics, chemistry and materials science. The scientific program contains sessions of two categories: (i) instrumentation and methodology and (ii) application of EM in materials science. The first category covers sessions like: TEM specimen preparation, analytical TEM (EFTEM, EELS), analytical SEM (EDS, CL, EBIC), electron diffraction/electron crystallography, image interpretation and analysis, and high resolution TEM. The second category comprises the application of electron microscopy to study a wide range of materials like metals and alloys, electronic materials, ceramics, polymers and composites, magnetic materials, amorphous materials, thin films as well as materials and structures for nanotechnology.