Awards

for the examination of the influence of the substrate on the properties of silicon epitaxial layers and parameters of the planar structures

for the contribution to the development of hallotrons technology and their application in measurement and processing

for the development and implementation of the first polish monolithic integrated circuits

for the development of the method for assessment of uniformity of the materials under study, especially semiconductor devices, by means of a laser emitter and index chart

for the contribution to the research, significant for the national economy and scientific and technological progress, in the field of galvanomagnetic devices

for the thermistor, manganese-nickel-cobalt measurement elements

for the development of the silicon avalanche photodiode

for the project of transistors with their connections produced in the process of double diffusion

in the field of technological progress for the contribution to the development of structures and for scientific achievements in the semiconductor device field

for scientific achievements in the field of semiconductor electronics