About us

The main tasks of our Depart­ment are cha­rac­te­ri­za­tion and modi­fi­ca­tion of mate­rials and devi­ces, using seve­ral gro­ups of methods. They are methods based espe­cially on elec­tron and ion micro­scopy tech­ni­ques:

TEM — Trans­mis­sion Elec­tron Micro­scopy (with HRTEM — High Reso­lu­tion TEM, as well),

SEM — Scan­ning Elec­tron Micro­scopy,

FIB – Focu­sed Ion Beam, used for micro- and nano-processing and Scan­ning Ion Micro­scopy.

Pho­to­vol­taic response measu­re­ments, car­rier life­time measu­re­ments based on micro­wave pho­to­con­duc­tance decay, and elec­tri­cal measu­re­ments (e.g. using gated diode) con­sti­tute other applied tech­ni­ques.

Three Euro­pean Union pro­jects (GSQ, SODAMOS, METAMOS) and mul­ti­ple natio­nal pro­jects (sup­por­ted by MNiSW, NCBiR, NCN) were/are reali­zed in our Depart­ment. Results of inve­sti­ga­tions were publi­shed in hun­dreds of publi­ca­tions in inter­na­tio­nal scien­ti­fic jour­nals (mostly from the JCR list) and con­fe­rence pro­ce­edings and they led to dozens of patents.