The main tasks of our Department are characterization and modification of materials and devices, using several groups of methods. They are methods based especially on electron and ion microscopy techniques:
TEM — Transmission Electron Microscopy (with HRTEM — High Resolution TEM, as well),
SEM — Scanning Electron Microscopy,
FIB – Focused Ion Beam, used for micro- and nano-processing and Scanning Ion Microscopy.
Photovoltaic response measurements, carrier lifetime measurements based on microwave photoconductance decay, and electrical measurements (e.g. using gated diode) constitute other applied techniques.
Three European Union projects (GSQ, SODAMOS, METAMOS) and multiple national projects (supported by MNiSW, NCBiR, NCN) were/are realized in our Department. Results of investigations were published in hundreds of publications in international scientific journals (mostly from the JCR list) and conference proceedings and they led to dozens of patents.