Electrical and photoelectric measurements laboratory
The laboratory performs measurements of the C(VG), I(VG) and G(VG) characteristics of semiconductor structures with ultimate sensitivity and resolution of 0.1 fA / 0.5 μV. This is primarily done using the Agilent B1500A semiconductor device...
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Optical measurements laboratory
The laboratory performs investigations which rely on the methods of spectroscopic ellipsometry, interferometry, reflectometry and Raman spectroscopy. These methods are used, among others, to determine the thickness and optical characteristics of...
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The offer of high tech services complex electrical sample analysis
1. Nanoelectronic device interface traps and surface properties mapping
2. Identification of the electrical equivalent circuit of the nanostructure and interfaces by means of admittance spectroscopy
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2. Identification of the electrical equivalent circuit of the nanostructure and interfaces by means of admittance spectroscopy
The offer of high tech services complex optical and photoelectric sample analysis
1. Ellipsometric characterization of samples in the vacuum UV range
2. Determination of MIS systems band diagrams using unique photoelectric methods
3. Determination of nanostructures chemical composition, temperature, stress, etc.
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2. Determination of MIS systems band diagrams using unique photoelectric methods
3. Determination of nanostructures chemical composition, temperature, stress, etc.
Our offer includes material and instrument analyzes carried out using TEM, SEM and scanning ion microscopy techniques as well as micro- and nanoprocessing using FIB techniques to modify or characterize materials and instruments.
