Publications

» 2022

  • P13621: A. Laszcz, A. Czerwinski, E. Pruszynska-Karbownik, M. Wzorek, D. Szmigiel: “Sensitive Metal-Semiconductor Nanothermocouples Fabricated by FIB to Investigate Laser Beams with Nanometer Spatial Resolution”, Sensors, vol.22, nr.1, (2022).

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» 2020

  • P13559: R. Jakiela, M. Galicka, P. Dziawa, G. Springholz, A. Barcz: “SIMS Accurate Determination of Matrix Composition of Topological Crystalline Insulator Material Pb1 − xSnxSe”, Surface & Interface Analysis, vol.52, nr.3, (2020).
  • P13595: L. Marona, P. Wisniewski, M. Wzorek, J. Smalc-Koziorowska, S. Grzanka, A. Bojarska, D. Schiavon, S. Stanczyk, A. Czerwinski, T. Czyszanowski, P. Perlin: “Surface Photochemical Corrosion as a Mechanism for Fast Degradation of InGaN UV Laser Diodes”, ACS Applied Materials & Interfaces, vol.12, nr.46, (2020).
  • P13601: M. Marciniak, A. Broda, M. Gebski, M. Dems, J. Muszalski, A. Czerwinski, J. Ratajczak, L. Marona, W. Nakwaski, J.A. Lott, T. Czyszanowski: “Tuning of Reflection Spectrum of a Monolithic High-Contrast Grating by Variation of Its Spatial Dimensions”, Optics Express, vol.28, nr.14, (2020).

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» 2019

  • P13330: K. Pagowska, M. Kozubal, A. Taube, A. Trajnerowicz, R. Kruszka, K. Golaszewska-Malec, E. Dynowska, R. Jakiela, A. Barcz: “Analysis of Defect Structure in GaN Epilayers Doped with Si Ion Implantation by RBS/c”, Nuclear Instruments & Methods in Physics Res. B, vol.450, (2019).
  • P13395: K. Pagowska, M. Kozubal, A. Taube, M. Guziewicz, K. Golaszewska-Malec, R. Kruszka, R. Jakiela, A. Barcz, A. Piotrowska: “Comparison of Defect Structure in Si and Ge Ion Implanted GaN Epilayers by RBS Channeling”, Nuclear Instruments & Methods in Physics Res. B, vol.444, (2019).
  • P13453: K. Pierscinski, M. Bugajski, T. Czyszanowski, A. Kolek, M. Wesolowski, M. Kuc, R.P. Sarzała, M. Dems, M. Pluska, D. Pierscinska, W. Strupinski, A. Czerwinski: “Coupled-Cavity AlInAs/InGaAs/InP Quantum Cascade Lasers Fabricated by Focused Ion Beam Processing”, JPhys Photonics, vol.1, nr.1, (2019).
  • P13458: A. Koroliov, G. Chen, K.M. Goodfellow, A. Nick Vamivakas, Z. Staniszewski, P. Sobolewski, M. El Fray, A. Laszcz, A. Czerwinski, C. Richter, R. Sobolewski: “Terahertz Time-Domain Spectroscopy of Graphene Nanoflakes Embedded in Polymer Matrix”, Applied Sciences-Basel, vol.9, nr.931, (2019).
  • P13516: R. Jakiela, K. Gas, M. Sawicki, A. Barcz: “Diffusion of Mn Gallium Nitride: Experiment and Modelling”, Journal of Alloys and Compounds, vol.771, (2019).
  • P13527: I. Jozwik, A. Barcz, E. Dabrowska, E. Dumiszewska, P.P. Michalowski: “Damage-Induced Voltage Alteration (DIVA) Contrast in SEM Images of Ion-Irradiated Semiconductors”, Ultramicroscopy, vol.204, (2019).

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» 2018

  • P13307: B. Synkiewicz, D. Szwagierczak, J. Ratajczak, A. Czerwinski: “Microstructure Characterization of LTCC Glass-Ceramic Composites with Various Degree of the Introduced Porosity”, Acta Physica Polonica A, vol.134, nr.1, (2018).
  • P13337: R. Jakiela, A. Barcz, J. Sarnecki, G.K. Celler: “Ultrahigh Sensitivity SIMS Analysis of Oxygen in Silicon”, Surface & Interface Analysis, vol.50, nr.7, (2018).
  • P13342: M. Kozubal, A. Szerling, K. Kosiel, M. Mysliwiec, K. Pagowska, R. Jakiela, R. Kruszka, M. Guziewicz, A. Barcz: “Electrical Isolation of GaAs and AlGaAs/GaAs Quantum Cascade Lasers by Deep Hydrogen Implantation”, Materials Science in Semiconductor Processing, vol.74, (2018).
  • P13369: M. Pluska, A. Czerwinski: “Elevated-Temperature Luminescence Measurements to Improve Spatial Resolution”, AIP Advances, vol.8, nr.1, (2018).
  • P13435: K. Pierscinski, D. Pierscinska, A. Kuzmicz, G. Sobczak, K. chmielewski, M. Pluska, A. Czerwinski, M. Bugajski: “Dwusekcyjne lasery kaskadowe na zakres średniej podczerwieni”, (2018).

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» 2017

  • P13124: B. Illes, A. Skwarek, R. Batorfi, J. Ratajczak, A. Czerwinski, O. Krammer, B. Medgyes, B. Horvath, T. Hurtony: “Whisker Growth from Vacuum Evaporated Submicron Sn Thin Films”, Surface & Coatings Technology, vol.311, (2017).
  • P13325: M. Pluska, A. Czerwinski: “Detrimental Nonlocality in Luminescence Measurements”, Journal of Applied Physics, vol.122, (2017).
  • P13341: A. Piotrowska, B. Mroziewicz, M. Pilch, M. Bugajski, J. Kaniewski, M. Borysiewicz, K. Golaszewska-Malec, J. Kaczmarski, E. Kaminska, A. Taube, H.M. Przewlocki, D. Tomaszewski, W. Krol, P. Dumania, D. Szmigiel, I. Wegrzecka, M. Wegrzecki, G. Janczyk, J. Klamka, J. Swiderski, A. Czerwinski, J. Ratajczak, A. Laszcz, M. Pluska, M. Wzorek, P. Guzdek, D. Szwagierczak, J. Kulawik, A. Skwarek, K. Zaraska, J. Walczak-Zlotkowska: “Pięćdziesiąt lat Instytutu Technologii Elektronowej 1966-2016”, lanl.arXiv.org/cond-mat/0306671, (2017).
  • P13364: I. Jozwik, E. Dabrowska, A. Malag, A. Barcz: “Communication-Direct Imaging of Irradiation Damage in Semiconductors by Low-Energy SEM”, ECS Journal of Solid State Science and Technology, vol.6, nr.7, (2017).

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» 2016

  • P13047: D. Urbanczyk, A. Wojcik-Jedlinska, J. Muszalski, A. Laszcz, M. Pluska, M. Gebski, T. Czyszanowski, A. Czerwinski, M. Bugajski: “Optical Examination of High Contrast Grating Fabricated by Focused-Ion Beam Etching”, Optical and Quantum Electronics, vol.48, nr.4, (2016).
  • P13080: M. Wzorek, M. Borysiewicz, A. Czerwinski, M. Mysliwiec, M. Ekielski, J. Ratajczak, A. Piotrowska, J. Katcki: “The Effect of Ni:Si Ratio on Microstructural Properties of Ni/Si Ohmic Contacts to SiC”, Applied Surface Science, vol.369, (2016).
  • P13150: A. Szerling, K. Kosiel, M. Kozubal, M. Mysliwiec, R. Jakiela, M. Kuc, T. Czyszanowski, R. Kruszka, K. Pagowska, P. Karbownik, A. Barcz, E. Kaminska, A. Piotrowska: “Proton Implantation for Isolation of AlGaAs/GaAs Quantum Cascade Lasers”, Semiconductor Science and Technology, vol.31, nr.7, (2016).
  • P13158: M. Pluska, A. Laszcz, J. Ratajczak, M. Wzorek, A. Czerwinski: “Zastosowanie zogniskowanej wiązki jonów do tworzenia, modyfikacji i charakteryzacji struktur elektronicznych i fotonicznych”, Elektronika, vol.LVII, nr.8, (2016).
  • P13203: A. Koroliov, Z. Staniszewski, G. Chen, R. Shrestha, A. Laszcz, A. Czerwinski, M. El Fray, C. Richter, R. Sobolewski: “Terahertz Spectroscopy of Isolated Graphene Flakes Inside Polymer-Based Nanocomposite Samples”, (2016).
  • P13250: S. Wonsak, C. Carulla, A. Abt, A. Affolder, A. Aleev, P.P. Allport, L. Andricek, A. Apresyan, R. Arcidiacono, M. Artuso, M.B. Baca, T. Barber, A. Barcz: “High Fluence Effects on Silicon Detectors: Damage and Defects Characterization an Overview of The State of the Art of Radiation Resistance Detectors ”, (2016).

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» 2015

  • P12860: A. Barcz, K. Pagowska, M. Kozubal, E. Guziewicz, M. Borysiewicz, J. Dyczewski, R. Jakiela, J. Ratajczak, D. Snigurenko, E. Dynowska: “Response of ZnO/GaN Heterostructure to Ion Irradiation”, Acta Physica Polonica A, vol.128, nr.5, (2015).
  • P12889: A. Barcz, R. Jakiela, M. Kozubal, J. Dyczewski, G.K. Celler: “Incorporation of Oxygen in SiC Implanted with Hydrogen”, Nuclear Instruments & Methods in Physics Res. B, vol.365, (2015).
  • P12955: A. Taube, E. Kaminska, M. Kozubal, J. Kaczmarski, W. Wojtasiak, J. Jasinski, M. Borysiewicz, M. Ekielski, M. Juchniewicz, J. Grochowski, M. Mysliwiec, E. Dynowska, A. Barcz, P. Prystawko, M. Zajac, R. Kucharski, A. Piotrowska: “Ion Implantation for Isolation of AlGaN/GaN HEMTs Using C or Al”, Physica Status Solidi A, vol.212, nr.5, (2015).
  • P12957: M. Pluska, A. Czerwinski, M. Wzorek, M. Juchniewicz, J. Katcki: “Identification and Reduction of Acoustic-Noise Influence on Focused Ion Beam (FIB)”, Nuclear Instruments & Methods in Physics Res. B, vol.348, (2015).
  • P12979: A. Skwarek, K. Witek, M. Pluska, A. Czerwinski: “Tin Whisker Growth on the Surface of Tin-Rich Lead-Free Alloys”, SMT Surface Mount Technology Magazine, nr.2, (2015).
  • P13009: M. Wzorek, A. Czerwinski, M. Borysiewicz, K. Golaszewska-Malec, M. Mysliwiec, J. Ratajczak, A. Piotrowska, J. Katcki: “Amorphous Ni-Zr Layer Applied for Microstructure Improvement of Ni-Based Ohmic Contacts to SiC”, Materials Science and Engineering B, vol.199, (2015).
  • P13028: K.E. Hnida, S. Bassler, L. Akinsinde, J. Gooth, K. Nielsch, R.P. Socha, A. Laszcz, A. Czerwinski, G.D. Sulka: “Tuning the Polarity of Charge Transport in InSb Nanowires via Heat Treatment”, Nanotechnology, vol.26, nr.28, (2015).
  • P13050: K. Pierscinski, D. Pierscinska, M. Pluska, P. Gutowski, I. Sankowska, P. Karbownik, A. Czerwinski, M. Bugajski: “Room Temperature, Single Mode Emission from Two-Section Coupled Cavity InGaAs/AlGaAs/GaAs Quantum Cascade Laser”, Journal of Applied Physics, vol.118, (2015).
  • P13051: A. Czerwinski, M. Pluska, A. Laszcz, J. Ratajczak, K. Pierscinski, D. Pierscinska, P. Gutowski, P. Karbownik, M. Bugajski: “Formation of Coupled-Cavities in Quantum Cascade Lasers Using Focused Ion Beam Milling”, Microelectronics Reliability, vol.55, nr.9-10, (2015).
  • P13071: A. Klimov, R. Puzniak, B. Aichner, W. Lang, E. Joon, R. Stern, W. Slysz, M. Guziewicz, M. Juchniewicz, M. Borysiewicz, R. Kruszka, M. Wegrzecki, A. Laszcz, A. Czerwinski, R. Sobolewski: “Superconducting and Ferromagnetic Properties of NbN/NiCu and NbTiN/NiCu Bilayer Nanostructures for Photon Detection”, (2015).
  • P13092: M. Pluska, A. Czerwinski, M. Wzorek, M. Juchniewicz, J. Katcki: “Determining the Causes of Scanning Distortions in SEM and FIB”, Microscopy and Microanalysis, vol.21, nr.Supp, (2015).
  • P13094: I.I. Syvorotka, D. Sugak, A. Wierzbicka, A. Wittlin, H. Przybylinska, J. Barzowska, A. Barcz, M. Berkowski, J. Domagala, S. Mahlik, M. Grinberg, Ch.-G. Ma, M.G. Brik, A. Kaminska, Z.R. Zytkiewicz, A. Suchocki: “Optical Properties of Pure and Ce3+ Doped Gadolinium Gallium Garnet Crystals and Epitaxial Layers”, Journal of Luminescence, vol.164, (2015).

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» 2014

  • P12664: T. Piotrowski, M. Wegrzecki, A. Czerwinski, G.I. Teslenko, O.Yu. Malyutenko, V.K. Malyutenko: “Recombination Properties of Diode Structures by Study of Thermal Emission Beyond the Fundamental Absorption Band”, (2014).
  • P12735: A. Laszcz, W. Nogala, A. Czerwinski, J. Ratajczak, J. Katcki: “Fabrication of Electrochemical Nanolectrode for Sensor Application Using Focused Ion Beam Technology”, Polish Journal of Chemical Technology, vol.16, nr.3, (2014).
  • P12749: M. Wzorek, A. Czerwinski, J. Ratajczak, M. Borysiewicz, A. Kuchuk, A. Piotrowska, J. Katcki: “Microstructure Characterization of Si/Ni Contact Layers on n-Type 4H-SiC by TEM and XEDS”, (2014).
  • P12754: A. Fedorczyk, J. Ratajczak, A. Czerwinski, M. Skompska: “Selective Deposition of Gold Nanoparticles on the Top or Inside a Thin Conducting Polymer Film, by Combination of Electroless Deposition and Electrochemical Reduction”, Electrochimica Acta, vol.122, (2014).
  • P12796: A. Skwarek, J. Kulawik, A. Czerwinski, M. Pluska, K. Witek: “A Method for the Tin Pest Presence Testing in SnCu Solder Alloys”, Soldering and Surface Mount Technology, vol.26, nr.3, (2014).
  • P12798: V.P. Amarasinghe, L. Wielunski, A. Barcz, L.C. Feldman, G.K. Celler: “Properties of H+ Implanted 4H-SiC as Related to Exfoliation of Thin Crystalline Films”, ECS Journal of Solid State Science and Technology, vol.3, nr.3, (2014).
  • P12799: A. Taube, M. Kozubal, J. Kaczmarski, M. Juchniewicz, A. Barcz, J. Dyczewski, R. Jakiela, E. Dynowska, M. Borysiewicz, P. Prystawko, J. Jasinski, P. Borowicz, E. Kaminska, A. Piotrowska: “High Resistivity Isolation for AlGaN/GaN HEMT Using Al Double-Implantation”, (2014).
  • P12804: M. Pluska, A. Czerwinski, A. Szerling, J. Ratajczak, J. Katcki: “Effect of Secondary Electroluminescence on Cathodoluminescence and other Luminescence Measurements”, Acta Physica Polonica A, vol.125, nr.4, (2014).
  • P12818: A. Barcz, M. Kozubal, R. Jakiela, J. Ratajczak, J. Dyczewski, K. Golaszewska-Malec, T. Wojciechowski, G.K. Celler: “Diffusion and Impurity Segregation in Hydrogen - Implanted Silicon Carbide”, Journal of Applied Physics, vol.115, (2014).
  • P12873: P. Kowalik, Z. Pruszowski, J. Kulawik, A. Czerwinski, M. Pluska: “Changes in TCR of Amorphous Ni-P Resistive Films as a Function of Thermal Stabilization Parameters”, Microelectronics International, vol.31, nr.3, (2014).
  • P12945: A. Czerwinski, A. Skwarek, M. Pluska, J. Ratajczak, K. Witek: “Whisker Growth in Tin Alloys on Glass-Epoxy Laminate”, SMT Surface Mount Technology Magazine, vol.29, nr.7, (2014).

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» 2013

  • P12530: A. Skwarek, K. Witek, M. Pluska, J. Ratajczak, A. Czerwinski: “Dependence of Tin Whisker Growth on Copper and Oxygen Content on the Surface of Tin-Rich Lead Free Alloys”, Acta Physica Polonica A, vol.123, nr.2, (2013).
  • P12532: A. Czerwinski, A. Skwarek, M. Pluska, J. Ratajczak, K. Witek: “Whisker Growth in Tin Alloys on Glass-Epoxy Laminate Studied by Energy-Dispersive X-Ray Spectroscopy”, Archives of Metallurgy and Materials, vol.58, nr.2, (2013).
  • P12643: A. Kuchuk, V.P. Kladko, Z. Adamus, M. Wzorek, M. Borysiewicz, P. Borowicz, A. Barcz, K. Golaszewska-Malec, A. Piotrowska: “Influence of Carbon Layer on the Properties of Ni-Based Ohmic Contact to n-Type 4H-SiC”, ISRN Electronics, vol.2013, (2013).
  • P12662: M. Guziewicz, A. Laszcz, J. Domagala, K. Golaszewska-Malec, J. Ratajczak, R. Kruszka, M. Juchniewicz, A. Czerwinski, W. Slysz: “Structural Analysis of Epitaxial NbTiN Films”, (2013).
  • P12734: I. Kaminska, M. Opallo, A. Laszcz, A. Czerwinski, J. Niedziolka-Jonsson: “(Bio)Electrocatalysis at Tin-Doped Indium Oxide Nanoparticle Film Decorated with Gold”, Electrochimica Acta, vol.106, (2013).
  • P12770: M. Guziewicz, A. Laszcz, J. Domagala, K. Golaszewska-Malec, J. Ratajczak, A. Czerwinski, W. Slysz: “Analiza struktury epitaksjalnych warstw NbTiN”, (2013).
  • P12784: V.P. Amarasinghe, L. Wielunski, A. Barcz, L.C. Feldman, G.K. Celler: “Optimization of H+ Implantation Parameters for Exfoliation of 4H-SiC Films”, (2013).
  • P12785: I. Mandic, A. Affolder, A. Aleev, P.P. Allport, L. Andricek, M. Artuso, L. Barabash, T. Barber, A. Barcz, M.R. Bartosik, M. Baselga, R. Bates, V. Benitez, J. Bernardini, C. Betancourt, A. Bhardwaj, G.M. Bilei, A. Blue, J. Bohm, M. Bomben, A. Borgia, L. Borrello, M.J. Bosma, T.J.V. Bowcock, J. Broz, M. Bruzzi, A. Brzozowski, P. Buhmann, C. Buttar, G. Calderini, M. Carna, N. Cartiglia, G. Casse, S. Charron, J. Chauveau, D. Chren, S. Cihangir, V. Cindro, P. Collins, E. Cortina Gil, D. Creanza, F. Crescioli, R. Dalal, W. de Boer, M. de Palma, P. Dervan, A. Dierlamm, D. Dobos, F. Doherty, I. Dolenc Kittelmann, Z. Dolezal, A. Dolgolenko, A. Driewer, S. Dutta, R. Eber, D. Eckstein, F. Eichhorn, L. Eklund, V. Eremin, I. Eremin, J. Erfle, S. Esteban, N. Fadeeva, V. Fadeev, S. Feigl, M. Fernandez, F. Fiori, N. Flaschel, C. Fleta, E. Focardi, D. Forshaw, E. Fretwurst, A.G. Bates, M. Gabrysch, C. Gallrapp, C. Garcia, E. Gaubas, M.H. Genest, S. Gibson, M. Glaser, C. Goessling, M. Golovleva, A. Golubev, G. Gomez, I. Gorelov, V. Greco, G. gregoire, I. Gregor, E. Grigoriev, A.A. Grillo, S. Grinstein, A. Groza, J. Guskov, J. Harkonen, F.G. Hartjes, F. Hartmann, S. Hidalgo, M. Hoeferkamp, R. Horisberger, A. Houdayer, D. Hynds, A.G. Ibanescu, I. Ilyashenko, R. Jaramillo, J. Jelena, J. Jentzsch, T. Jindra, A. Junkes, V. Kalendra, P. Kaminski, A. Karpenko, K. Kaska, N. Kazuchits, V. Kazukauskas, V. Khivrich, J. Kierstead, R. Klanner, R. Klingenberg, P. Kodys, E. Koffeman, Z. Kohout, A. Konoplyannikov, I. Korolkov, R. Kozlowski, M. Kozubal, G. Kramberger, S. Kuehn, S. Kwan, A. La Rosa, C. Lacasta, J. Lange, V. Lastovetsky, I. Lazanu, S. Lazanu, C. Lebel, P. Lefebvre, V. Lemaitre, C. Leroy, Z. Li, G. Lindstrom, P. Litovchenko, I. Lopez, D. Loukas, M. Lozano, Z. Luczynski, P. Luukka, A. Macchiolo, A. Macraighne, T. Maenpaa, L.F. Makarenko, D. Maneuski, N. Manna, G. Marchiori, R. Marco, S. Marti i Garcia, S. Marunko, P. Masek, M. Matysek, H. McDuff, A. Mekys, A. Messineo, M. Mikestikova, M. Mikuz, O. Militaru, M. Milovanovic, M. Moll, R. Mori, H.G. Moser, D. Muenstermann, F.J. Munoz Sanchez, A. Naletko, H. Neugebauer, A. Nikitin, R. Nisius, S.V. Nistor, L.C. Nistor, A. Nurnberg, A. Oblakowska-Mucha, V. OShea, N. Pacifico, C. Parkes, U. Parzefall, D. Passeri, M. Pawlowski, G. Pellegrini, H. Pernegger, M. Petasecca, G.U. Pignatel, I. Pintilie, L. Pintilie, K. Piotrzkowski, R. Placekett, Th. Pohlsen, L. Polivtsev, J. Popule, S. Pospisil, M. Printz, D. Quirion, V. Radicci, R. Radu, K. Ranjan, R. Richter, J. Rodriguez, R. Roeder, S. Rogozkhin, T. Rohe, I. Rubinskiy, A. Rummler, A. Ruzin, H.F.W. Sadrozinski, N. Samadashvili, M. Scaringella, B. Schumm, S. Seidel, A. Seiden, R.K. Shivpuri, J. Sibille, P. Sicho, S. Singh, T. Slavicek, M. Solar, U. Soldevila-Serrano, V. Sopko, N. Spencer, L. Spiegel, A. Srivastava, G. Steinbruck, G. Stewart, J. Storasta, B. Surma, T. Szumlak, K. Tackmann, P. Tan, S. Terzo, T. Timo, M. Tomasek, K. Toms, S. Tsiskaridze, Yu. Tuboltsev, E. Tuominen, E. Tuovinen, T. Tuuva, M. Tylchin, H. Uebersee, M. Ullan, J.V. Vaitkus, M. van Beuzekom, E. Verbitskaya, I. Vila Alvarez, J. Visser, J. Vossebeld, V. Vrba, R. Wang, P. Weigell, L. Wiik, I. Wilhelm, T. Wittig, S. Wonsak, R. Wunstorf: “Silicon Sensors for HL-LHC Tracking Detectors”, Nuclear Instruments & Methods in Physics Res. A, vol.732, (2013).

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» 2012

  • P12277: A. Czerwinski, A. Skwarek, M. Pluska, J. Ratajczak, K. Witek: “Tin Pest and Tin Oxidation on Tin-Rich Lead Free Alloys Investigated by Electron Microscopy Methods”, Solid State Phenomena, vol.186, (2012).
  • P12278: A. Skwarek, M. Pluska, A. Czerwinski, K. Witek: “Influence of Substrate Type on Tin Whisker Growth in Tin-Rich Lead-Free Solder Alloys”, Materials Science and Engineering B, vol.177, (2012).
  • P12358: M. Borysiewicz, E. Kaminska, M. Mysliwiec, M. Wzorek, A. Kuchuk, A. Barcz, E. Dynowska, M.-A. di Forte-Poisson, C. Giesen, A. Piotrowska: “Fundamentals and Practice of Metal Contacts to Wide Band Gap Semiconductor Devices”, Crystal Research and Technology, vol.47, nr.3, (2012).
  • P12370: J. Ratajczak, K. Hejduk, M. Lipinski, T. Piotrowski, M. Pluska, A. Laszcz, A. Czerwinski: “Study of Silicon Nanoparticles Formation in Silicon Nitride”, Solid State Phenomena, vol.186, (2012).
  • P12384: M. Wzorek, A. Czerwinski, A. Kuchuk, J. Ratajczak, A. Piotrowska, J. Katcki: “Ni-Based Ohmic Contacts to Silicon Carbide Examined by Electron Microscopy”, Solid State Phenomena, vol.186, (2012).
  • P12385: M. Pluska, A. Czerwinski, J. Ratajczak, A. Szerling, J. Katcki: “Defect Detection in Semiconductor Layers with Built-In Electric Field with the Use Cathodoluminescence”, Physica B, vol.407, (2012).
  • P12388: A. Laszcz, A. Czerwinski, J. Ratajczak, A. Taube, S. Gieraltowska, A. Piotrowska, J. Katcki: “Study of Oxides Formed in the HfO2/Si Structure for High-k Dielectric Applications”, Solid State Phenomena, vol.186, (2012).
  • P12398: M. Pluska, A. Czerwinski, J. Ratajczak, A. Szerling, J. Katcki: “Cathodoluminescence and Electroluminescence of Semiconductor Structures in SEM”, Solid State Phenomena, vol.186, (2012).
  • P12480: L. Marona, S. Grzanka, R. Czernecki, J. Goss, M. Bockowski, P. Perlin, P. Kruszewski, M. Pluska, A. Czerwinski: “Estimation of the Recombination Coefficients in Aged InGaN Laser Diodes”, (2012).
  • P12516: P. Borowicz, M. Latek, W. Rzodkiewicz, A. Laszcz, A. Czerwinski, J. Ratajczak: “Deep-Ultraviolet Raman Investigation of Silicon Oxide: Thin Film on Silicon Substrate Versus Bulk Material”, Advances in Natural Sciences: Nanoscience and Nanotechnology, vol.3, (2012).
  • P12525: K. Switkowski, C. Jastrzebski, N. Palka, J. Dyczewski, A. Barcz: “Performance of a Nitrogen Implanted Large Aperture THz Emitter”, Photonics Letters of Poland, vol.4, nr.1, (2012).
  • P12554: J. Bak-Misiuk, P. Romanowski, A. Misiuk, J. Sadowski, R. Jakiela, A. Barcz: “Effect of Stress on Structural Transformations in GaMnAs”, Journal of Nanoscience and Nanotechnology, vol.12, (2012).

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» 2011

  • P11819: A. Skwarek, M. Pluska, J. Ratajczak, A. Czerwinski, K. Witek, D. Szwagierczak: “Analysis of Tin Whisker Growth on Lead-Free Alloys with Ni Presence under Thermal Shock Stress”, Materials Science and Engineering B, vol.176, (2011).
  • P11881: T. Piotrowski, V.K. Malyutenko, M. Wegrzecki, A. Czerwinski, H. Polakowski, A.M. Tykhonov: “Optimization of Parameters for Silicon Planar Source of Modulated Infrared Radiation”, Materials Science and Engineering B, vol.176, (2011).
  • P12051: A. Misiuk, J. Bak-Misiuk, A. Barcz, P. Romanowski, B. Surma, A. Wnuk: “Structure of Self-Implanted Silicon Annealed under Enhanced Hydrostatic Pressure”, High Pressure Research, vol.31, nr.1, (2011).
  • P12092: A. Misiuk, A. Barcz, J. Bak-Misiuk, A.G. Ulyashin, P. Romanowski: “Hydrogen Gettering Within Processed Oxygen-Implanted Silicon”, (2011).
  • P12098: A. Laszcz, J. Ratajczak, A. Czerwinski, J. Katcki, N. Breil, G. Larrieu, E. Dubois: “TEM Studies of PtSi Low Schottky-Barrier Contacts for Source/Drain in MOS Transistors”, Central European Journal of Physics, vol.9, (2011).
  • P12136: M. Kaniewska, O. Engstrom, A. Karmous, O. Kirfel, E. Kasper, B. Raeissi, J. Piscator, G. Zaremba, M. Kaczmarczyk, B. Surma, A. Wnuk, M. Wzorek, A. Czerwinski: “Hole Emission Mechanism in Ge/Si Quantum Dots”, Physica Status Solidi C, vol.8, (2011).
  • P12137: M. Kaniewska, O. Engstrom, A. Karmous, O. Kirfel, E. Kasper, B. Raeissi, J. Piscator, G. Zaremba, M. Kaczmarczyk, M. Wzorek, A. Czerwinski, B. Surma, A. Wnuk: “Spatial Variation of Hole Eigen Energies in Ge/Si Quantum Wells”, (2011).
  • P12138: A. Czerwinski, M. Pluska, J. Ratajczak, A. Szerling, J. Katcki: “Electron Microscopy Studies of Non-Local Effects Impact on Cathodoluminescence of Semiconductor Laser Structures”, Materials Transactions, vol.52, (2011).
  • P12144: M. Wzorek, A. Czerwinski, A. Kuchuk, J. Ratajczak, A. Piotrowska, J. Katcki: “TEM Characterisation of Silicide Phase Formation in Ni-Based Ohmic Contacts to 4H n-SiC”, Materials Transactions, vol.52, (2011).
  • P12189: K. Zaraska, J. Gaudyn, A. Bienkowski, M. Dohnalik, A. Czerwinski, M. Pluska, M. Machnik: “X-Ray Inspection of LTCC Devices”, (2011).
  • P12229: A. Misiuk, W.K. Wierzchowski, K. Wieteska, A. Barcz, J. Bak-Misiuk, L. Chow, R. Vanfleet, M. prujszczyk: “Properties of Si:V Annealed under Enhanced Hydrostatic Pressure”, Acta Physica Polonica A, vol.120, nr.1, (2011).
  • P12231: A. Czerwinski: “Badanie półprzewodników wiązką elektronów, fotonów lub jonów - wpływ nielokalnych właściwości materiału na mierzony sygnał”, lanl.arXiv.org/cond-mat/0306671, (2011).
  • P12247: A. Skwarek, M. Pluska, A. Czerwinski, K. Witek: “Influence of Substrate Type on Tin Whisker Growth for Tin-Rich Lead-Free Solder Alloys”, (2011).
  • P12258: A. Skwarek, M. Sroda, M. Pluska, A. Czerwinski, J. Ratajczak, K. Witek: “Occurence of Tin Pest on the Surface of Tin-Rich Lead-Free Alloys”, Soldering and Surface Mount Technology, vol.23, nr.3, (2011).
  • P12269: K. Zaraska, J. Gaudyn, A. Bienkowski, M. Dohnalik, A. Czerwinski, M. Pluska, M. Machnik, K. Wojcik: “X-Ray Inspection of LTCC Devices: Theory and Practice”, Journal of Microelectronics and Electronic Packaging, vol.8, (2011).
  • P12300: K. Zaraska, J. Gaudyn, A. Bienkowski, A. Czerwinski, M. Pluska: “Surface Properties of Laser-Etched LTCC Ceramic”, (2011).
  • P12382: M. Wzorek, A. Czerwinski, A. Kuchuk, J. Ratajczak, A. Piotrowska, J. Katcki: “Badania elektronomikroskopowe kontaktów omowych do węglika krzemu wytwarzanych na bazie niklu”, Elektronika, vol.LII, nr.9, (2011).
  • P12383: M. Wzorek, A. Laszcz, A. Czerwinski, J. Ratajczak, M. Pluska, M. Borysiewicz, A. Taube, S. Gieraltowska, A. Kuchuk, K. Korwin-Mikke, A. Piotrowska, J. Katcki: “Badania elektronomikroskopowe struktur półprzewodnikowych wytwarzanych w oparciu o SiC i ZnO”, (2011).
  • P12526: R. Jakiela, E. Dumiszewska, P. Caban, A. Stonert, A. Turos, A. Barcz: “Oxygen Diffusion into GaN from Oxygen Implanted GaN or Al2O3”, Physica Status Solidi C, vol.8, nr.5, (2011).
  • P12528: A. Affolder, A. Aleev, P.P. Allport, L. Andricek, M. Artuso, J.P. Balbuena, L. Barabash, T. Barber, A. Barcz, D. Bassignana, R. Bates, M. Battaglia, M. Beimforde, J. Bernardini, C. Betancourt, G.M. Bilei, B. Bisello, A. Blue, J. Bohm, G. Bolla, A. Borgia, L. Borrello, D. Bortoletto, M. Boscardin, M.J. Bosma, T.J.V. Bowcock, M. Breindl, J. Broz, M. Bruzzi, A. Brzozowski, P. Buhmann, C. Buttar, F. Campabadal, A. Candelori, G. Casse, S. Charron, D. Chren, S. Cihangir, V. Cindro, P. Collins, E. Cortina Gil, C.A. Costinoaia, D. Creanza, C. Cristobal, G.F. Dalla Beta, W. de Boer, M. de Palma, R. Demina, A. Dierlamm, S. Diez, D. Dobos, F. Doherty, I. Dolenc Kittelmann, Z. Dolezal, A. Dolgolenko, C. Dragoi, A. Driewer, S. Dutta, D. Eckstein, L. Eklund, V. Eremin, J. Erfle, N. Fadeeva, M. Fahrer, F. Fiori, C. Fleta, E. Focardi, D. Forshaw, E. Fretwurst, M. Frey, A.G. Bates, C. Gallrapp, C. Garcia, E. Gaubas, M.H. Genest, K. Giolo, M. Glaser, C. Goessling, A. Golubev, I. Gorelov, G. gregoire, P. Gregori, E. Grigoriev, A.A. Grillo, S. Grinstein, A. Groza, J. Guskov, T.E. Hansen, J. Harkonen, F.G. Hartjes, F. Hartmann, M. Hoeferkamp, R. Horisberger, A. Houdayer, D. Hynds, I. Ilyashenko, A. Junkes, A. Kadys, P. Kaminski, A. Karpenko, K. Kaska, N. Kazuchits, V. Kazukauskas, A. Kharchuk, V. Khivrich, J. Kierstead, R. Klanner, R. Klingenberg, P. Kodys, E. Koffeman, K. Kohler, Z. Kohout, S. Korjenevski, I. Korolkov, R. Kozlowski, M. Kozubal, G. Kramberger, S. Kuehn, S. Kuleshov, A. Kuznetsov, S. Kwan, A. La Rosa, C. Lacasta, J. Lange, K. Lassila-Perini, V. Lastovetsky, I. Lazanu, S. Lazanu, C. Lebel, P. Lefebvre, V. Lemaitre, C. Leroy, G. Lindstroem, Z. Li, A. Litovchenko, P. Litovchenko, M. Lozano, Z. Luczynski, P. Luukka, A. Macchiolo, A. Macraighne, T. Maenpaa, L.F. Makarenko, I. Mandic, D. Maneuski, N. Manna, R. Marco, S. Marti i Garcia, S. Marunko, P. Masek, K. Mathieson, M. Matysek, J. Mekki, A. Messineo, J. Metcalfe, M. Mikestikova, M. Mikuz, O. Militaru, M. Minano, J. Miyamoto, M. Moll, E. Monokhov, R. Mori, H.G. Moser, D. Muenstermann, F.J. Munoz Sanchez, A. Naletko, R. Nisius, V. OShea, N. Pacifico, D. Pantano, C. Parkes, U. Parzefall, D. Passeri, M. Pawlowski, G. Pellegrini, H. Pernegger, M. Petasecca, C. Piemonte, G.U. Pignatel, I. Pintilie, L. Pintilie, K. Piotrzkowski, R. Placekett, Th. Pohlsen, L. Polivtsev, J. Popule, S. Pospisil, J. Preiss, V. Radicci, R. Radu, J.M. Raf, M. Rando, R. Richter, R. Roeder, S. Rogozkhin, T. Rohe, S. Ronchin, C. Rott, A. Roy, A. Rummler, A. Ruzin, H.F.W. Sadrozinski, S. Sakalauskas, N. Samadashvili, M. Scaringella, B. Schumm, S. Seidel, A. Seiden, I. Shipsey, J. Sibille, P. Sicho, T. Slavicek, M. Solar, U. Soldevila-Serrano, S. Son, V. Sopko, B. Sopko, N. Spencer, L. Spiegel, A. Srivastava, G. Steinbruck, G. Stewart, D. Stolze, J. Storasta, B. Surma, B.G. Svensson, P. Tan, M. Tomasek, K. Toms, S. Tsiskaridze, A. Tsvetkov, Yu. Tuboltsev, E. Tuominen, E. Tuovinen, T. Tuuva, M. Tylchin, H. Uebersee, M. Ullan, J.V. Vaitkus, M. van Beuzekom, E. Verbitskaya, I. Vila Alvarez, J. Visser, J. Vossebeld, V. Vrba, M. Walz, P. Weigell, L. Wiik, I. Wilhelm, R. Wunstorf, A. Zaluzhny, M. Zavrtanik, J. Zelazko, M. Zen, V. Zhukov, D. Zontar, N. Zorzi: “Silicon Detectors for the sLHC”, Nuclear Instruments & Methods in Physics Res. A, vol.658, (2011).

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» 2010

  • P11684: J. Ratajczak, A. Laszcz, A. Czerwinski, J. Katcki, F. Phillipp, P.A. van Aken, N. Reckinger, E. Dubois: “Transmission Electron Microscopy Study of Erbium Silicide Formation from Ti/Er Stack for Schottky Contact Applications”, Journal of Microscopy, vol.237, nr.3, (2010).
  • P11703: A. Laszcz, A. Czerwinski, J. Ratajczak, A. Szerling, F. Phillipp, P.A. van Aken, J. Katcki: “Transmission Electron Microscopy Characterisation of Au/Pt/Ti/Pt/GaAs Ohmic Contacts for High Power GaAs/InGaAs Semiconductor Lasers”, Journal of Microscopy, vol.237, nr.3, (2010).
  • P11705: A. Czerwinski, M. Pluska, J. Ratajczak, A. Szerling, J. Katcki: “Dependence of Cathodoluminescence on Layer Resistance Applied for Measurement of Thin-Layer Sheet Resistance”, Journal of Microscopy, vol.237, nr.3, (2010).
  • P11730: M. Wzorek, A. Czerwinski, J. Ratajczak, A. Lui, E. Iacob, J. Katcki: “Depth Measurements of Etch-Pits in GaN with Shape Reconstruction from SEM Images”, Journal of Microscopy, vol.237, nr.3, (2010).
  • P11742: M. Pluska, A. Czerwinski, J. Ratajczak, J. Katcki, Ł. Oskwarek, R. Rak: “Identification of Electron Beam Vibration Sources by Separation of Magnetic Distortion from Electric Distortion on Scanning Electron Microscope Imaging”, Journal of Microscopy, vol.237, nr.3, (2010).
  • P11772: A. Laszcz, J. Ratajczak, A. Czerwinski, J. Katcki, V. Srot, F. Phillipp, P.A. van Aken, D.A. Yarekha, N. Reckinger, G. Larrieu, E. Dubois: “Characterization of Ytterbium Silicide Formed in Ultra High Vacuum”, (2010).
  • P11959: A. Misiuk, A.G. Ulyashin, A. Barcz, P. Formanek: “Accumulation of Hydrogen within Implantation-Damaged Areas in Processes Si:N and Si:O”, Solid State Phenomena, vol.156-158, (2010).
  • P11966: A. Misiuk, A.G. Ulyashin, A. Barcz, J. Bak-Misiuk, M. prujszczyk: “Temperature-Dependent Release of Deuterium Accumulated in Spongy-Like Layers Buried in Czochralski Silicon”, (2010).
  • P12017: A. Skwarek, M. Pluska, K. Witek, A. Czerwinski, W. Filipowski: “Analiza występowania wiskerów na powierzchni wysokocynowych stopów lutowniczych poddanych działaniu skrajnych warunków środowiskowych”, (2010).
  • P12034: A. Skwarek, K. Witek, M. Pluska, A. Czerwinski, W. Filipowski: “Analiza występowania wiskerów na powierzchni wysokocynowych stopów lutowniczych poddanych działaniu skrajnych warunków środowiskowych”, Elektronika, vol.LI, nr.9, (2010).
  • P12043: Z. Adamus, A. Kuchuk, M. Wzorek, A. Barcz, E. Kaminska, A. Piotrowska: “Formation of Ni/Si Based Ohmic Contacts to n-Type 4H-SiC”, Elektronika, vol.LI, nr.9, (2010).
  • P12044: Z. Adamus, A. Kuchuk, M. Wzorek, A. Barcz, E. Kaminska, A. Piotrowska: “Formation of Ni/Si Based Ohmic Contacts to n-Type 4H-SiC”, (2010).
  • P12045: A. Piotrowska, P. Mihalovits, E. Kaminska, M. Borysiewicz, M. Wzorek, T. Gutt, H.M. Przewlocki, M. Guziewicz, M. Ekielski, M. Juchniewicz, K. Korwin-Mikke, A. Taube, R. Kruszka, I. Pasternak, Z. Adamus, K. Golaszewska-Malec, A. Barcz, A. Czerwinski, G. Zaremba: “Innowacyjne technologie wielofunkcyjnych materiałów i struktur dla nanoelektroniki, fotoniki, spintroniki i technik sensorowych (InTechFun)”, (2010).
  • P12054: A. Barcz: “Silicon Dioxide as a Boundary for Oxygen Outdiffusion from CZ-Si”, Defect and Diffusion Forum, vol.297-301, (2010).
  • P12087: A. Misiuk, A. Barcz, A.G. Ulyashin, M. prujszczyk, J. Bak-Misiuk, P. Formanek: “Defects in High Temperature-Pressure Processed Si:N Revealed by Deuterium Plasma Treatment”, Fizika i Tiechnika Wysokich Dawlienij, vol.20, nr.4, (2010).
  • P12170: A. Misiuk, A. Barcz, A.G. Ulyashin, I.V. Antonova, M. prujszczyk: “Hydrogen Gettering in Annealed Oxygen-Implanted Silicon”, Semiconductor Physics, Quantum Electronics & Optoelectronics, vol.13, nr.2, (2010).

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» 2009

  • P11475: M. Wzorek, A. Czerwinski, J. Ratajczak, R. Dylewicz, J. Katcki: “Selective Etching of Dislocations in GaN and Quantitative SEM Analysis with Shape-reconstruction Method”, Micron, nr.40, (2009).
  • P11484: M. Pluska, Ł. Oskwarek, R. Rak, A. Czerwinski: “Measurement of Magnetic Field Distorting the Electron Beam Direction in Scanning Electron Microscope”, IEEE Transactions on Instrumentation and Measurement, vol.58, nr.1, (2009).
  • P11487: M. Pluska, A. Czerwinski, J. Ratajczak, J. Katcki, Ł. Oskwarek, R. Rak: “Separation of Image-distrotion Sources and Magnetic-field Measurement in Scanning Electron Microscope (SEM)”, Micron, nr.40, (2009).
  • P11551: A. Misiuk, A.G. Ulyashin, A. Barcz, J. Bak-Misiuk, P. Romanowski, M. prujszczyk: “Buried Spongy-like Layers Silicon Implanted with He+, Annealed and Treated on D+ Plasma”, Physica Status Solidi C, vol.6, nr.7, (2009).
  • P11575: J. Bak-Misiuk, A. Misiuk, P. Romanowski, A. Barcz, R. Jakiela, E. Dynowska, J. Domagala, W. Caliebe: “Effect of Processing on Microstructure of Si:Mn”, Materials Science and Engineering B, vol.159-160, (2009).
  • P11646: A. Skwarek, J. Ratajczak, K. Witek, A. Czerwinski, J. Kulawik: “Effect of Cu Addition on Whiskers Formation on the Surface of Tin-rich Alloys under Thermal Shock Stress”, Applied Surface Science, nr.255, (2009).
  • P11676: A. Misiuk, A. Barcz, J. Bak-Misiuk, P. Romanowski, L. Chow, E. Choi: “Stress-mediated Redistribution of Mn in Annealed Si:Mn”, Materials Science and Engineering B, vol.159-160, (2009).
  • P11678: A. Misiuk, W.K. Wierzchowski, B. Surma, A. Wnuk, J. Bak-Misiuk, K. Wieteska, A. Barcz, A. Andrianakis, C.A. Londos, D. Yang, M. prujszczyk, W. Graeff: “Defects in Czochralski Grown Si-Ge Annealed Under High Hydrostatic Pressure”, Radiation Physics and Chemistry, vol.78, (2009).
  • P11706: M. Pluska, A. Czerwinski, J. Ratajczak, J. Katcki, L. Marona, R. Czernecki, M. Leszczyński, P. Perlin: “New Approach to Cathodoluminescence Studies in Application to InGaN/GaN Laser Diode Degradation”, Journal of Microscopy, vol.236, nr.2, (2009).
  • P11788: A. Skwarek, M. Pluska, J. Ratajczak, A. Czerwinski, K. Witek, D. Szwagierczak: “Analysis of Tin Whisker Growth on Lead-free Alloys Under Thermal Shock Stress”, (2009).
  • P11808: T. Piotrowski, V.K. Malyutenko, O.Yu. Malyutenko, M. Wegrzecki, A. Czerwinski, H. Polakowski, A.M. Tykhonov: “Optimization of Parameters for Silicon Planar Source of Modulated Infrared Radiation”, (2009).
  • P11812: A. Misiuk, A. Barcz, M. prujszczyk, P. Romanowski, J. Bak-Misiuk: “Solid Phase Epitaxial Re-Growth of Amorphous Layer in Self-Implanted Silicon Annealed Under Enhanced Hydrostatic Pressure”, (2009).
  • P11813: A. Misiuk, A.G. Ulyashin, A. Barcz, P. Romanowski, J. Bak-Misiuk: “Deuterium Accumulation within Nano-Structured Layers in Si:He upon Plasma Treatment”, Physica Status Solidi A, vol.6, nr.12, (2009).
  • P11844: A. Laszcz, J. Ratajczak, A. Czerwinski, J. Katcki, F. Phillipp, P.A. Aken van, D.A. Yarekha, N. Reckinger, G. Larrieu, E. Dubois: “HRTEM Characterization of Erbium Silicide Formed in Ultra-High Vacuum”, (2009).
  • P11880: J. Ratajczak, A. Laszcz, A. Czerwinski, J. Katcki, X. Tang, N. Reckinger, D.A. Yarekha, G. Larrieu, E. Dubois: “TEM Characterization of Polysilicon and Silicide Fin Fabrication Processes of FinFETs”, Acta Physica Polonica A, vol.116, nr.Sup, (2009).
  • P11913: M. Pluska, A. Czerwinski, J. Ratajczak, A. Szerling, J. Katcki: “Dependence of Nanoelectronic-Structure Defect Detection by Cathodoluminescence on Electron Beam Current”, Acta Physica Polonica A, vol.116, nr.Sup, (2009).
  • P11928: E. Kaminska, I. Pasternak, A. Piotrowska, O. Volnianska, P. Bogusławski, E. Dynowska, A. Barcz, E. Przezdziecka: “A Study of Dual Acceptor Behaviour in p-ZnO: Ag-N and Sb-N”, (2009).
  • P11976: L. Marona, P. Wisniewski, M. Leszczyński, P. Prystawko, I. Grzegory, T. Suski, S. Porowski, R. Czernecki, A. Czerwinski, M. Pluska, J. Ratajczak, P. Perlin: “What is New in Nitride Laser Diodes Reliability Studies”, Physica Status Solidi C, vol.6, nr.S2, (2009).
  • P12052: A. Szczepanik, L. Wachnicki, M. Godlewski, E. Guziewicz, K. Kopalko, E. Janik, E. Lusakowska, A. Czerwinski, M. Pluska, S. Yatsunenko: “ZnO Nanostructures by Atomic Layer Deposition Method”, (2009).

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» 2008

  • P11108: A. Misiuk, A. Barcz, L. Chow, B. Surma, J. Bak-Misiuk, M. prujszczyk: “Properties of Si:Cr Annealed under Enhanced Stress Conditions”, Solid State Phenomena, vol.131-133, (2008).
  • P11195: W. Osinniy, A. Misiuk, M. Szot, K. Swiatek, J. Bak-Misiuk, A. Barcz, M. prujszczyk, T. Story: “Magnetic Properties of Silicon Crystals Implanted with Manganese”, Materials Science-Poland, vol.26, nr.3, (2008).
  • P11422: A. Saad, O. Velichko, Yu. Shaman, A. Fedotov, A. Barcz, A. Misiuk, V. Fedotova: “Investigation of the Hydrogen Transport Processes in Crystalline Silicon of n-type Conductivity”, Solid State Phenomena, vol.131-133, (2008).
  • P11486: A. Czerwinski, M. Pluska, J. Ratajczak, A. Szerling, J. Katcki: “Impact of Resistance on Cathodoluminescence and its Application for Layer Sheet-resistance Measurements”, Applied Physics Letters, vol.93, (2008).
  • P11558: A. Misiuk, A.G. Ulyashin, A. Barcz, J. Bak-Misiuk: “Hydrogen Accumulation within Nano-structured Areas in Implanted Silicon”, World Journal of Engineering, vol.5, nr.4, (2008).
  • P11616: J. Bak-Misiuk, P. Romanowski, J. Domagala, A. Misiuk, E. Dynowska, A. Barcz, W. Caliebe: “Mn-containing Nanoclusters in Magnetically Ordered Si:Mn and GaMnAs ”, World Journal of Engineering, vol.5, nr.4, (2008).
  • P11620: J. Bak-Misiuk, P. Romanowski, J. Domagala, A. Misiuk, E. Dynowska, A. Barcz, J. Sadowski, W. Caliebe: “Mn-containing Nanoclusters in MagneticallyOrdered Si:Mn and GaMnAs”, (2008).
  • P11621: A. Misiuk, A.G. Ulyashin, A. Barcz, J. Bak-Misiuk: “Hydrogen Accumulation within Nano-structured Areas in Implanted Silicon”, (2008).
  • P11631: P. Perlin, T. Swietlik, L. Marona, R. Czernecki, T. Suski, M. Leszczyński, I. Grzegory, S. Krukowski, G. Nowak, G. Kamler, A. Czerwinski, M. Pluska, M. Bednarek, J. Rybinski, S. Porowski: “Fabrication and Properties of GaN-based Lasers”, Journal of Crystal Growth, vol.310, (2008).
  • P11642: A. Laszcz, J. Ratajczak, A. Czerwinski, K. Kosiel, J. Kubacka-Traczyk, J. Muszalski, M. Bugajski, J. Katcki: “Electron Microscopy of GaAs/AlGaAs Quantum Cascade Laser”, (2008).
  • P11672: A. Laszcz, J. Ratajczak, A. Czerwinski, J. Katcki, V. Srot, F. Phillipp, P.A. van Aken, N. Breil, G. Larrieu, E. Dubois: “Transmission Electron Microscopy Study of the Platinum Germanide Formation Process in the Ge/Pt/Ge/SiO2/Si Structure”, Materials Science and Engineering B, nr.154-, (2008).
  • P11677: A. Misiuk, A. Barcz, L. Chow, J. Bak-Misiuk, P. Romanowski, A. Shalimov, A. Wnuk, B. Surma, R. Vanfleet, M. prujszczyk: “Pressure-induced Structural Transformations in Si:V (Si:V,Mn)”, Fizika i Tiechnika Wysokich Dawlienij, vol.18, nr.4, (2008).
  • P11729: L. Marona, P. Wisniewski, M. Leszczyński, I. Grzegory, T. Suski, S. Poprowski, R. Czernecki, A. Czerwinski, M. Pluska, J. Ratajczak, P. Perlin: “Why InGaN Laser-diode Degradation is a Accompanied by the Improvement of its Thermal Stability?”, (2008).
  • P11763: J. Baszkiewicz, D. Krupa, J.A. Kozubowski, B. Rajchel, M. Lewandowska-Szumiel, A. Barcz, J.W. Sobczak, A. Kosinski, A. Chroscicka: “Effect of Sodium-ion Implantation on the Properties Titanium”, Journal of Materials Science: Materials in Medicine, nr.19, (2008).

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» 2007

  • P10052: A. Misiuk, A. Barcz: “Pressure Mediated Emission of Hydrogen from Buried Porous Layers in Silicon CO - Implanted with H2+ and He+”, Physica Status Solidi C, vol.4, nr.6, (2007).
  • P10088: M. Wzorek, A. Czerwinski, J. Ratajczak, A. Misiuk, J. Katcki: “Hydrostatic Pressure Effect on Dislocation Evolution in Self-implanted Si Investigated by Electron Microscopy Methods”, Vacuum, vol.81, (2007).
  • P10229: A. Czerwinski, M. Pluska, J. Ratajczak, A. Szerling, J. Katcki: “Layer or Strip Resistance Measurement by EBIC”, Materials Transactions, vol.48, nr.5, (2007).
  • P10362: M. Wzorek, A. Czerwinski, J. Ratajczak, A. Misiuk, J. Katcki: “Defect Structure in Self-implanted Silicon Annealed under Enhanced Hydrostatic Pressure-electron Microscopy Study”, Physica Status Solidi C, vol.4, nr.8, (2007).
  • P10366: L. Marona, P. Wisniewski, M. Leszczyński, P. Prystawko, I. Grzegory, T. Suski, S. Porowski, R. Czarnecki, A. Czerwinski, M. Pluska, J. Ratajczak, P. Perlin: “Comprehensive Study of Reliability of InGaN Based Laser Diodes”, (2007).
  • P10468: M. Kozlowski, J. Marciak-Kozlowska, A. Czerwinski, M. Wzorek, M. Pluska: “Thermal Relaxation Times for Nanoparticles Heated by Ultra Short Laser Pulses”, Lasers in Engineering, vol.17, (2007).
  • P10546: A. Misiuk, L. Chow, A. Barcz, J. Bak-Misiuk, W. Osinniy, M. prujszczyk: “Silicon Based Materials for Application in Spintronics”, Sensor Electronics and Microsystem Technologies, vol.3, (2007).
  • P11423: J. Baszkiewicz, D. Krupa, B. Rajchel, J.A. Kozubowski, A. Barcz, J.W. Sobczak, A. Kosinski: “Effect of Sodium-ion Implantation on the Properties of the Surface Layers Formed on CoCrMo Alloy (Endocast SL)”, Vacuum, vol.81, nr.10, (2007).
  • P11424: M. Kalisz, R.B. Beck, A. Barcz, M. Cwil: “The Role of Fluorine-containing Ultra-thin Layer in Controlling Boron Thermal Diffusion Into Silicon”, Journal of Telecommunications and Information Technology, nr.3, (2007).
  • P11425: M. Kaminski, S. Podsiadlo, K. Wozniak, Ł. Dobrzycki, R. Jakiela, A. Barcz, M. Psoda, J. Mizera: “Growth and Structural Properties of Thick GaN Layers Obtained by Sublimation Sandwich Method”, Journal of Crystal Growth, vol.303, (2007).
  • P11426: D. Krupa, J. Baszkiewicz, B. Rajchel, A. Barcz, J.W. Sobczak, A. Bilinski, T. Borowski: “Effect of Calcium-ion Implantation on the Corrosion Resistance and Bioactivity of the Ti6A14V Alloy”, Vacuum, vol.81, (2007).
  • P11483: M. Pluska, A. Czerwinski, Ł. Oskwarek, R. Rak: “Quantitative Measurement of Electromagnetic Distortions in Scanning Electron Microscope (SEM)”, (2007).

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» 2006

  • P10043: A. Laszcz, J. Katcki, J. Ratajczak, A. Czerwinski, N. Breil, E. Dubois, G. Larrieu: “TEM Study of PtSi Contact Layers for Low Schottky Barrier MOSFETs”, Nuclear Instruments & Methods in Physics Res. B, vol.253, nr.1-2, (2006).
  • P10061: V.D. Akhmetov, A. Misiuk, A. Barcz, H. Richter: “Pressure - Induced Transformations of Nitrogen Implanted Into Silicon”, Physica Status Solidi A, vol.206, nr.4, (2006).
  • P10116: A. Czerwinski, M. Pluska, J. Ratajczak, J. Katcki: “In-situ EBIC Measurements of Local-thickness in Semiconductor Devices”, Journal of Microscopy, vol.224, (2006).
  • P10170: M. Kaniewska, O. Engstrom, A. Barcz, M. Pacholak-Cybulska: “Deep Levels Induced by InAs/GaAs Quantum Dots”, Materials Science and Engineering C, vol.26, nr.5-7, (2006).
  • P10171: E. Kaminska, E. Przezdziecka, A. Piotrowska, J. kossut, E. Dynowska, W. Dobrowolski, A. Barcz, R. Jakiela, E. Lusakowska, J. Ratajczak: “ZnO-based P-N Junctions with P-type ZnO by ZnTe Oxidation”, (2006).
  • P10172: M. Kaniewska, O. Engstrom, A. Barcz, M. Pacholak-Cybulska: “Electrical Activity of Deep Levels in the Presence of InAs/GaAs Quantum Dots”, Materials Science in Semiconductor Processing, vol.9, nr.1-3, (2006).
  • P10230: A. Czerwinski, M. Pluska, J. Ratajczak, A. Szerling, J. Katcki: “Resistance and Scheet Resistance Measurements Using Electron Beam Induced Current”, Applied Physics Letters, nr.89, (2006).
  • P10232: A. Laszcz, A. Czerwinski, J. Ratajczak, J. Katcki, N. Breil, E. Dubois, G. Larrieu: “TEM Study of Iridium Silicide Contact Layers for Low Schottky Barrier MOSFETs”, Archives of Metallurgy and Materials, vol.51, nr.4, (2006).
  • P10242: A. Misiuk, B. Surma, J. Bak-Misiuk, A. Barcz, W. Jung, W. Osinniy, A. Shalimov: “Effect of Pressure Annealing on Structure of Si:Mn”, Materials Science in Semiconductor Processing, vol.9, nr.1-3, (2006).
  • P10275: R. Jakiela, A. Barcz, E. Dumiszewska, A. Jagoda: “Si Diffusion in Epitaxial GaN”, Physica Status Solidi C, vol.3, nr.6, (2006).
  • P10276: R. Jakiela, A. Barcz, E. Wegner, A. Zagojski: “Diffusion on Mn in Gallium Arsenide”, Journal of Alloys and Compounds, nr.423, (2006).
  • P10280: J. Adey, G. Alfieri, P.P. Allport, M. Ambrico, L. Andricek, M. Artuso, S. Assouak, L. Barabash, A. Barcz, R. Bates, S.F. Biagi, G.M. Bilei, B. Bisello, A. Blue, A. Blumenau, V. Boisvert, G. Bolla, E. Borchi, L. Borrello, D. Bortoletto, M. Boscardin, T.J.V. Bowcock, T.J. Brodbeck, J. Broz, M. Bruzzi, A. Brzozowski, M. Buda, P. Buhmann, P. Bussey, C. Buttar, F. Campabadal, D. Campbell, A. Candelori, G. Casse, A. Cavallini, S. Charron, A. Chilingarov, D. Chren, V. Cindro, P. Collins, R. Coluccia, D. Contarato, J. Coutinho, D. Creanza, W. Cunningham, G.F. Dalla Beta, I. Dawson, W. de Boer, M. de Palma, R. Demina, P. Dervan, S. Diez, F. Doherty, I. Dolenc, Z. Dolezal, A. Dolgolenko, T. Eberlein, S. Eckert, T. Ehrich, L. Eklund, V. Eremin, C. Fall, F. Fizzotti, C. Fleta, E. Focardi, E. Forton, E. Fretwurst, S. Furgeri, A.G. Bates, C. Garcia, Y. Garino, E. Gaubas, M.H. Genest, K.A. Gill, K. Giolo, M. Glaser, C. Goessling, V. Golovine, S. Gonzales Sevilla, I. Gorelov, J. Goss, G. gregoire, P. Gregori, E. Grigoriev, A.A. Grillo, A. Groza, J. Guskov, L. Haddad, T.E. Hansen, J. Harkonen, F.G. Hartjes, F. Hartmann, H. Hodlmoser, M. Hoeferkamp, F. Honniger, T. Horazdowsky, R. Horisberger, A. Houdayer, B. Hourahine, G. Huges, I. Ilyashenko, A. Ivanov, J. James, K. Jarasinuas, K.M.H. Johansen, R. Jones, B.K. Jones, C. Joram, E. Kalinina, P. Kaminski, A. Karpenko, A. Karpov, S. Kazakov, V. Kazlauskiene, N. Kazuchits, V. Kazukauskas, V. Khivrich, V. Khomenkov, J. Kierstead, R. Klingenberg, P. Kodys, E. Koffeman, Z. Kohout, S. Korjenevski, M. Koski, R. Kozlowski, M. Kozubal, G. Kramberger, S. Kuehn, A. Kuznetsov, S. Kwan, C. Lacasta, S. Lagomarsino, K. Lassila-Perini, V. Lastovetsky, I. Lazanu, S. Lazanu, A. Lebedev, C. Lebel, K. Leinonen, V. Lemaitre, C. Leroy, Z. Li, T. Ligonzo, G. Lindstrom, V. Linhart, P. Litovchenko, A. Litovchenko, A. Lo Giudice, M. Lozano, Z. Luczynski, P. Luukka, A. Macchiolo, L.F. Makarenko, I. Mandic, C. Manfredotti, N. Manna, A. Martemianov, S. Marti i Garcia, S. Marunko, K. Mathieson, J. Melone, D. Menichelli, A. Messineo, J. Metcalfe, S. Miglio, M. Mikuz, O. Militaru, M. Minano, J. Miyamoto, M. Moll, E. Monakhov, H.G. Moser, E. Nossarzewska-Orlowska, J. Nysten, V. OShea, T. Palviainen, D. Pantano, C. Parkes, U. Parzefall, D. Passeri, U. Pein, G. Pellegrini, D. Pennicard, M. Petasecca, C. Piemonte, G.U. Pignatel, N. Pinho, L. Pintilie, I. Pintilie, K. Piotrzkowski, L. Polivtsev, A. Popa, J. Popule, S. Pospisil, A. Pozza, V. Radicci, J.M. Rafi, M. Rando, R. Richter, P. Rodeghiero, R. Roeder, S. Rogozkhin, T. Rohe, S. Ronhin, C. Rott, A. Roy, A. Ruzin, A. Saavedra, H.F.W. Sadrozinski, S. Sakalauskas, M. Scaringella, L. Schiavulli, B. Schumm, S. Sciortino, G. Segneri, S. Seidel, A. Seiden, G. Sellberg, D. Sentenac, I. Shipsey, P. Sicho, T. Sloan, S. Son, V. Sopko, B. Sopko, N. Spencer, J. Stahl, D. Stolze, J. Storasta, N. Strokan, M. Sudzius, B. Surma, B.G. Svensson, P. Tipton, M. Tomasek, C. Tosi, A. Tsvetkov, E. Tuominen, E. Tuovinen, T. Tuuva, M. Tylchin, H. Uebersee, J. Uher, M. Ullan, J.V. Vaitkus, H. Van der Graaf, E. Vataga, E. Verbitskaya, J.L. Visschers, J. Vossebeld, V. Vrba, J. Weber, Q. Wei, I. Wilhelm, I. Wright, R. Wunstorf, P. Zabierowski, A. Zaluzhny, M. Zavrtanik, M. Zen, V. Zhukov, N. Zorzi: “Radiation Tolerant Semiconductor Sensors for Tracking Detectors”, Nuclear Instruments & Methods in Physics Res. A, nr.565, (2006).
  • P10281: J. Adey, G. Alfieri, P.P. Allport, M. Ambrico, L. Andricek, M. Artuso, S. Assouak, L. Barabash, A. Barcz, R. Bates, S.F. Biagi, G.M. Bilei, B. Bisello, A. Blue, A. Blumenau, V. Boisvert, G. Bolla, E. Borchi, L. Borrello, D. Bortoletto, M. Boscardin, T.J.V. Bowcock, T.J. Brodbeck, J. Broz, M. Bruzzi, A. Brzozowski, M. Buda, P. Buhmann, P. Bussey, C. Buttar, F. Campabadal, D. Campbell, A. Candelori, G. Casse, A. Cavallini, S. Charron, A. Chilingarov, D. Chren, V. Cindro, P. Collins, R. Coluccia, D. Contarato, J. Coutinho, D. Creanza, W. Cunningham, G.F. Dalla Beta, I. Dawson, W. de Boer, M. de Palma, R. Demina, P. Dervan, S. Diez, F. Doherty, I. Dolenc, Z. Dolezal, A. Dolgolenko, T. Eberlein, S. Eckert, T. Ehrich, L. Eklund, V. Eremin, C. Fall, F. Fizzotti, C. Fleta, E. Focardi, E. Forton, E. Fretwurst, S. Furgeri, A.G. Bates, C. Garcia, Y. Garino, E. Gaubas, M.H. Genest, K.A. Gill, K. Giolo, M. Glaser, C. Goessling, V. Golovine, S. Gonzales Sevilla, I. Gorelov, J. Goss, G. gregoire, P. Gregori, E. Grigoriev, A.A. Grillo, A. Groza, J. Guskov, L. Haddad, T.E. Hansen, J. Harkonen, F.G. Hartjes, F. Hartmann, H. Hodlmoser, M. Hoeferkamp, F. Honniger, T. Horazdowsky, R. Horisberger, A. Houdayer, B. Hourahine, G. Huges, I. Ilyashenko, A. Ivanov, J. James, K. Jarasinuas, K.M.H. Johansen, R. Jones, B.K. Jones, C. Joram, E. Kalinina, P. Kaminski, B.G. Svensson, P. Tipton, M. Tomasek, A. Tsvetkov, E. Tuominen, E. Tuovinen, T. Tuuva, M. Tylchin, H. Uebersee, J. Uher, M. Ullan, J.V. Vaitkus, H. Van der Graaf, E. Vataga, E. Verbitskaya, J.L. Visschers, J. Vossebeld, V. Vrba, J. Weber, Q. Wei, I. Wilhelm, I. Wright, R. Wunstorf, P. Zabierowski, A. Zaluzhny, M. Zavrtanik, M. Zen, V. Zhukov, N. Zorzi: “Radiation-hard Detectors for Very High Luminosity Colliders”, Nuclear Instruments & Methods in Physics Res. A, nr.560, (2006).
  • P10288: M. Pluska, A. Czerwinski, J. Ratajczak, J. Katcki, R. Rak: “Elimination of SEM-image Periodic Distoritions with Digital Signal Processing Methods”, Journal of Microscopy, vol.224, (2006).
  • P10352: A. Misiuk, L. Chow, A. Barcz, B. Surma, J. Bak-Misiuk, P. Romanowski, W. Osinniy, F. Salman, G. Chai, M. prujszczyk, A. Trojan: “New Silicon-based Materials for Spintronics Applications - Si:V and Si:Cr”, (2006).

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» 2005

  • P10110: D. Krupa, J. Baszkiewicz, J.A. Kozubowski, A. Barcz, J.W. Sobczak, A. Bilinski, M. Lewandowska-Szumiel, B. Rajchel: “Effect of Dual Ion Implantation of Calcium and Phosphorus on the Properties of Titanum”, Biomaterials, vol.26, nr.16, (2005).
  • P10117: J. Lu, A. Czerwinski, L. Kordas, W. Zhao, G. Rozgonyi: “Characterization of Threading Dislocations in Strained-Si/SiGe Heterostructures Using Preferential Two-step Etching and MOS-EBIC”, (2005).
  • P10130: D. Dobosz, K. Golaszewska-Malec, Z.R. Zytkiewicz, E. Kaminska, A. Piotrowska, T.T. Piotrowski, A. Barcz, R. Jakiela: “Properties of ZrN Films as Substrate Masks in Liquid Phase Epitaxial Lateral Overgrowth of Compound Semiconductors”, Crystal Research and Technology, vol.40, nr.4-5, (2005).
  • P10164: E. Kaminska, A. Piotrowska, J. kossut, A. Barcz, R. Butkute, W. Dobrowolski, E. Dynowska, R. Jakiela, E. Przezdziecka, R. Lukasiewicz, M. Aleszkiewicz, P. Wojnar, E. Kowalczyk: “Transparent P-type ZnO Films Obtained by Oxidation of Sputter-deposited Zn3N2”, Solid State Communications, vol.135, nr.1-2, (2005).
  • P10165: E. Kaminska, J. kossut, A. Piotrowska, E. Przezdziecka, W. Dobrowolski, E. Dynowska, R. Butkute, A. Barcz, R. Jakiela, M. Aleszkiewicz, E. Janik, E. Kowalczyk: “Transparent P-type ZnO by Oxidation of Zn-based Compound”, AIP Conference Proceedings, vol.772, (2005).
  • P10228: A. Misiuk, A. Barcz, B. Surma, J. Bak-Misiuk: “Effect of Pressure on Emission of Hydrogen from Silicon CO-implanted with Hydrogen and Helium”, (2005).
  • P10233: A. Misiuk, J. Bak-Misiuk, K. Orlinska, A. Barcz, B. Surma, M. prujszczyk: “Struktura krzemu implantowanego azotem i wygrzanego w warunkach podwyższonego ciśnienia hydrostatycznego”, (2005).
  • P10245: A. Misiuk, B. Surma, A. Barcz, K. Orlinska, J. Bak-Misiuk, I.V. Antonova, S. Dub: “Strain and Defect Engineering in Si/Si3N4/Si by High Temperature-pressure Traetment”, Materials Science and Engineering B, vol.124-125, (2005).
  • P10250: I.V. Antonova, A. Misiuk, C.A. Londos, B. Surma, S.A. Smagulova, A. Bukowski, W. Jung, A. Barcz: “Pressure-induced Formation of Electrically Active Centers in Irradiated Silicon: Comparison of Electron and Neutron Irradiation”, Vacuum, vol.77, (2005).
  • P10343: M. Zaborowski, P. Grabiec, A. Barcz: “Manufacturing of Pt-electrode by Wet Etching ”, Microelectronic Engineering, vol.82, nr.3-4, (2005).
  • P10555: M. Bruzzi, J. Adey, A. Al-Ajili, P. Alexandrov, G. Alfieri, P.P. Allport, A. Andreazza, M. Artuso, S. Assouak, B.S. Avset, L. Barabash, Baranova, A. Barcz, A. Basile, R. Bates, M. Belova, S.F. Biagi, G.M. Bilei, B. Bisello, A. Blue, A. Blumenau, V. Boisvert, G. Bolla, G. Bondarenko, E. Borchi, L. Borrello, D. Bortoletto, M. Boscardin, L. Bosisio, T.J.V. Bowcock, T.J. Brodbeck, J. Broz, A. Brukhanov, A. Brzozowski, M. Buda, P. Buhmann, C. Buttar, F. Campabadal, D. Campbell, A. Candelori, G. Casse, A. Cavallini, A. Chilingarov, D. Chren, V. Cindro, M. Citterio, P. Collins, R. Coluccia, D. Contarato, J. Coutinho, D. Creanza, W. Cunningham, V. Cvetkov, G.F. Dalla Beta, G. Davies, I. Dawson, W. de Boer, M. de Palma, R. Demina, P. Dervan, A. Dierlamm, S. Dittongo, L. Dobrzanski, Z. Dolezal, A. Dolgolenko, T. Eberlein, V. Eremin, C. Fall, F. Fasolo, T. Ferbel, F. Fizzotti, C. Fleta, E. Focardi, E. Forton, S. Franchenko, E. Fretwurst, F. Gamaz, C. Garcia, J.E. Garcia-Navarro, E. Gaubas, M.H. Genest, K.A. Gill, K. Giolo, M. Glaser, C. Goessling, V. Golovine, S. Gonzales Sevilla, I. Gorelov, J. Goss, A. Gouldwell, G. gregoire, P. Gregori, E. Grigoriev, C. Grigson, A.A. Grillo, A. Groza, J. Guskov, L. Haddad, J. Harkonen, R. Harding, F. Hauler, S. Hayama, M. Hoeferkamp, F. Honniger, T. Horazdowsky, R. Horisberger, M. Horn, A. Houdayer, B. Hourahine, A. Hruban, G. Huges, I. Ilyashenko, K. Irmscher, A. Ivanov, K. Jarasinuas, T. Jin, B.K. Jones, R. Jones, C. Joram, L. Jungermann, E. Kalinina, P. Kaminski, A. Karpenko, A. Karpov, V. Kazlauskiene, V. Kazukauskas, V. Khivrich, V. Khomenkov, J. Kierstead, J. Klaiber-Lodewigs, M. Kleverman, R. Klingenberg, P. Kodys, Z. Kohout, S. Korjenevski, A. Kowalik, R. Kozlowski, M. Kozodaev, G. Kramberger, O. Krasel, A. Kuznetsov, S. Kwan, S. Lagomarsino, T. Lari, K. Lassila-Perini, V. Lastovetsky, G. Latino, S. Latushkin, S. Lazanu, I. Lazanu, C. Lebel, K. Leinonen, C. Leroy, Z. Li, G. Lindstrom, J.L. Lindstrom, V. Linhart, A. Litovchenko, P. Litovchenko, V. Litvinov, A. Lo Giudice, M. Lozano, Z. Luczynski, P. Luukka, A. Macchiolo, A. Mainwood, L.F. Makarenko, I. Mandic, C. Manfredotti, S. Marti i Garcia, S. Marunko, K. Mathieson, A. Mozzanti, J. Melone, D. Menichelli, C. Meroni, A. Messineo, S. Miglio, M. Mikuz, J. Miyamoto, M. Moll, E. Monakhov, F. Moscatelli, L. Murin, F. Nava, D. Naoumov, E. Nossarzewska-Orlowska, S. Nummela, J. Nysten, P. Olivero, V. OShea, T. Palviainen, C. Paolini, C. Parkes, D. Passeri, U. Pein, G. Pellegrini, R. Perera, M. Petasecca, B. Piatkowski, C. Piemonte, G.U. Pignatel, N. Pinho, I. Pintilie, L. Pintilie, L. Polivtsev, P. Polozov, A. Popa, J. Popule, S. Pospisil, G. Pucker, V. Radicci, J.M. Rafi, F. Ragusa, M. Rahman, M. Rando, R. Roeder, T. Rohe, S. Ronhin, C. Rott, P. Roy, A. Roy, A. Ruzin, A. Ryazanov, H.F.W. Sadrozinski, S. Sakalauskas, M. Scaringella, L. Schiavulli, S. Schnetzer, B. Schumm, S. Sciortino, A. Scorzoni, G. Segneri, S. Seidel, A. Seiden, G. Sellberg, P. Sellin, D. Sentenac, I. Shipsey, P. Sicho, T. Sloan, M. Solar, S. Son, V. Sopko, N. Spencer, J. Stahl, I. Stavitski, D. Stolze, R. Stone, J. Storasta, N. Strokan, W. Strupinski, M. Sudzius, B. Surma, J. Suuronen, A. Suvorov, B.G. Svensson, P. Tipton, M. Tomasek, C. Troncon, A. Tsvetkov, E. Tuominen, E. Tuovinen, T. Tuuva, M. Tylchin, H. Uebersee, J. Uher, M. Ullan, J.V. Vaitkus, P. Vanni, J. Velthuis, G. Verzellesi, E. Verbitskaya, V. Vrba, G. Wagner, I. Wilhelm, S. Worm, V. Wright, R. Wunstorf, P. Zabierowski, A. Zaluzhny, M. Zavrtanik, M. Zen, V. Zhukov, N. Zorzi: “Radiation-hard Semiconductor Detectors for SuperLHC”, Nuclear Instruments & Methods in Physics Res. A, vol.541, nr.1-2, (2005).
  • P10558: E. Fretwurst, J. Adey, A. Al-Ajili, G. Alfieri, P.P. Allport, M. Artuso, S. Assouak, B.S. Avset, L. Barabash, A. Barcz, R. Bates, S.F. Biagi, G.M. Bilei, B. Bisello, A. Blue, A. Blumenau, V. Boisvert, G. Bolla, G. Bondarenko, E. Borchi, L. Borrello, D. Bortoletto, M. Boscardin, L. Bosisio, T.J.V. Bowcock, T.J. Brodbeck, J. Broz, M. Bruzzi, A. Brzozowski, M. Buda, P. Buhmann, C. Buttar, F. Campabadal, D. Campbell, A. Candelori, G. Casse, A. Cavallini, S. Charron, A. Chilingarov, D. Chren, V. Cindro, P. Collins, R. Coluccia, D. Contarato, J. Coutinho, D. Creanza, W. Cunningham, G.F. Dalla Beta, I. Dawson, W. de Boer, M. de Palma, R. Demina, P. Dervan: “Recent Advancements in the Development of Radiation Hard Semiconductor Detectors for S-LHC”, Nuclear Instruments & Methods in Physics Res. A, vol.552, nr.1-2, (2005).
  • P10564: R. Jakiela, A. Barcz, E. Wegner, A. Zagojski: “Diffusion and Activation of Zn Implanted Into InP:S”, Vacuum, vol.78, nr.2-4, (2005).
  • P10565: W. Jung, A. Misiuk, J. Ratajczak, A. Barcz: “Effect of Heat Treatment at Enhanced Pressure on Electrical and Structural Properties of Silicon Surface Layer Co-implanted with Hydrogen and Helium Ions”, Opto-Electronics Review, vol.13, nr.1, (2005).
  • P10566: E. Kaminska, A. Piotrowska, K. Golaszewska-Malec, R. Lukasiewicz, A. Szczesny, E. Kowalczyk, P. Jagodzinski, M. Guziewicz, A. Kudla, A. Barcz, R. Jakiela: “Thermally Stable Transparent Ru-Si-O Schottky Contacts for n-type GaN and AlGaN”, (2005).
  • P10567: E. Kaminska, A. Piotrowska, A. Szczesny, R. Lukasiewicz, A. Kuchuk, K. Golaszewska-Malec, R. Kruszka, A. Barcz, R. Jakiela, E. Dynowska, A. Stonert, A. Turos: “Thermally Stable Ru-Si-O Gate Electrode for AlGaN/GaN HEMT”, Physica Status Solidi C, vol.2, nr.3, (2005).
  • P10568: E. Kaminska, A. Piotrowska, J. kossut, R. Butkute, W. Dobrowolski, R. Lukasiewicz, A. Barcz, R. Jakiela, E. Dynowska, E. Przezdziecka, M. Aleszkiewicz, E. Kowalczyk: “P-type Conducting ZnO: Fabrication and Characterization”, Physica Status Solidi C, vol.2, nr.3, (2005).
  • P10569: D. Krupa, J. Baszkiewicz, B. Rajchel, A. Barcz, J.W. Sobczak, A. Bilinski: “Effect of Sodium-ion Implantation on the Corrosion Resistance and Bioactivity of Titanum”, Vacuum, vol.78, nr.2-4, (2005).
  • P10577: M. Moll, J. Adey, A. Al-Ajili, G. Alfieri, P.P. Allport, M. Artuso, S. Assouak, B.S. Avset, L. Barabash, A. Barcz, R. Bates, S.F. Biagi, G.M. Bilei, B. Bisello, A. Blue, A. Blumenau, V. Boisvert, G. Bolla, G. Bondarenko, E. Borchi, L. Borrello, D. Bortoletto, M. Boscardin, L. Bosisio, T.J.V. Bowcock, T.J. Brodbeck, J. Broz, M. Bruzzi, A. Brzozowski, M. Buda, P. Buhmann, C. Buttar, F. Campabadal, D. Campbell, A. Candelori, G. Casse, A. Cavallini, S. Charron, A. Chilingarov, D. Chren, V. Cindro, P. Collins, R. Coluccia, D. Contarato, J. Coutinho, D. Creanza, W. Cunningham, G.F. Dalla Beta, I. Dawson, W. de Boer, M. de Palma, R. Demina, P. Dervan, S. Dittongo, Z. Dolezal, A. Dolgolenko, T. Eberlein, V. Eremin, C. Fall, F. Fasolo, F. Fizzotti, C. Fleta, E. Focardi, E. Forton, E. Fretwurst, C. Garcia, J.E. Garcia-Navarro, E. Gaubas, M.H. Genest, K.A. Gill, K. Giolo, M. Glaser, C. Goessling, V. Golovine, S. Gonzales Sevilla, I. Gorelov, J. Goss, A. Gouldwell, G. gregoire, P. Gregori, E. Grigoriev, A.A. Grillo, A. Groza, J. Guskov, L. Haddad, J. Harkonen, F. Hauler, M. Hoeferkamp, F. Honniger, T. Horazdowsky, R. Horisberger, M. Horn, A. Houdayer, B. Hourahine, G. Huges, I. Ilyashenko, K. Irmscher, T. Ivanov, K. Jarasinuas, K.M.H. Johansen, B.K. Jones, R. Jones, C. Joram, L. Jungermann, E. Kalinina, P. Kaminski, A. Karpenko, A. Karpov, V. Kazlauskiene, V. Kazukauskas, V. Khivrich, V. Khomenkov, J. Kierstead, J. Klaiber-Lodewigs, R. Klingenberg, P. Kodys, Z. Kohout, S. Korjenevski, M. Koski, R. Kozlowski, M. Kozodaev, G. Kramberger, O. Krasel, A. Kuznetsov, S. Kwan, S. Lagomarsino, K. Lassila-Perini, V. Lastovetsky, G. Latino, S. Lazanu, I. Lazanu, A. Lebedev, C. Lebel, K. Leinonen, C. Leroy, C. Li, G. Lindstrom, V. Linhart, A. Litovchenko, P. Litovchenko, A. Lo Giudice, M. Lozano, Z. Luczynski, P. Luukka, A. Macchiolo, L.F. Makarenko, I. Mandic, C. Manfredotti, N. Manna, S. Marti i Garcia, S. Marunko, K. Mathieson, J. Melone, D. Menichelli, A. Messineo, J. Metcalfe, S. Miglio, M. Mikuz, J. Miyamoto, E. Monakhov, F. Moscatelli, D. Naoumov, E. Nossarzewska-Orlowska, J. Nysten, P. Olivero, V. OShea, T. Palviainen, C. Paolini, C. Parkes, D. Passeri, U. Pein, G. Pellegrini, R. Perera, M. Petasecca, C. Piemonte, G.U. Pignatel, N. Pinho, I. Pintilie, L. Pintilie, L. Polivtsev, P. Polozov, A. Popa, J. Popule, S. Pospisil, A. Pozza, V. Radicci, J.M. Rafi, M. Rando, R. Roeder, T. Rohe, S. Ronhin, C. Rott, A. Roy, A. Ruzin, H.F.W. Sadrozinski, S. Sakalauskas, M. Scaringella, L. Schiavulli, S. Schnetzer, B. Schumm, S. Sciortino, A. Scorzoni, G. Segneri, S. Seidel, A. Seiden, G. Sellberg, P. Sellin, D. Sentenac, I. Shipsey, P. Sicho, T. Sloan, M. Solar, S. Son, B. Sopko, V. Sopko, N. Spencer, J. Stahl, D. Stolze, R. Stone, J. Storasta, N. Strokan, M. Sudzius, B. Surma, A. Suvorov, B.G. Svensson, P. Tipton, M. Tomasek, A. Tsvetkov, E. Tuominen, E. Tuovinen, T. Tuuva, M. Tylchin, H. Uebersee, J. Uher, M. Ullan, J.V. Vaitkus, J. Velthuis, E. Verbitskaya, V. Vrba, G. Wagner, I. Wilhelm, S. Worm, I. Wright, R. Wunstorf, Y. Yiuri, P. Zabierowski, A. Zaluzhny, M. Zavrtanik, M. Zen, V. Zhukov, N. Zorzi: “Development of Radiation Tolerant Semiconductor Detectors for the Super-LHC”, Nuclear Instruments & Methods in Physics Res. A, vol.546, nr.1-2, (2005).

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» 2004

  • P10349: A. Barcz, A. Panas, R. Jakiela: “Out-and In-diffusion of Oxygen 16 O in Silicon”, Semiconductor Science and Technology, vol.19, nr.11, (2004).
  • P10364: A. Czerwinski, E. Simoen, A. Poyal, C. Claeys: “Local Electric Fields in Silicided Shallow Junctions”, Journal of the Electrochemical Society, vol.151, nr.9, (2004).
  • P10365: A. Czerwinski, L. Kordas, K.R. Bray, W. Zhao, R. Wise, G. Rozgonyi: “The Impact of Strained Si/SiGe Heterostructure Dislocation on the Electrical Activity of Perfects”, (2004).
  • P10373: W. Zhao, K.R. Bray, A. Czerwinski, L. Kordas, R. Wise, G. Rozgonyi: “Chemical and Structural Characterization of Perfects in Strained-Si/SiGe Heterostructure”, (2004).
  • P10434: A. Misiuk, B. Surma, J. Ratajczak, J. Katcki, M. Wzorek, A. Barcz, A. Wnuk, J. Jagielski: “Nanostructures Formation by High Temperature-pressure Treatment of Silicon Implanted with Hydrogen/Helium”, Superlattices and Microstructures, vol.36, nr.1-3, (2004).
  • P10614: I.V. Antonova, A. Misiuk, A. Barcz, D. Yang, V.P. Popov: “Gettering of Impurities in Hydrogen Implanted Nitrogen-Doped Silicon”, Solid State Phenomena, vol.95-96, (2004).
  • P10653: E. Kaminska, K. Golaszewska-Malec, A. Piotrowska, R. Kruszka, A. Kuchuk, E. Papis, R. Szeloch, P. Janus, T. Gotszalk, A. Barcz, A. Wawro: “Study of Long-term Stability of Ohmic Contacts to GaN”, Physica Status Solidi C, vol.1, nr.2, (2004).
  • P10654: E. Kaminska, A. Piotrowska, J. kossut, R. Butkute, W. Dobrowolski, K. Golaszewska-Malec, A. Barcz, R. Jakiela, E. Dynowska, E. Przezdziecka, D. Wawer: “P-type in ZnO:N by Codoping with Cr”, (2004).
  • P10684: A. Misiuk, J. Ratajczak, A. Barcz, J. Bak-Misiuk, A. Shalimov, B. Surma, A. Wnuk, J. Jagielski, I.V. Antonova: “Effect of Stress on Accumulation of Hydrogen and Microstructure of Silicon Co-implanted with Hydrogen and Helium”, (2004).
  • P10685: A. Misiuk, A. Barcz, J. Ratajczak, J. Bak-Misiuk: “Effect of External Stress at Annealing on Microstructure of Silicon Co-implanted with Hydrogen and Helium”, Solid State Phenomena, vol.95-96, (2004).
  • P10689: A. Misiuk, A. Barcz, B. Surma, J. Bak-Misiuk, A. Wnuk: “Microstructure of Czochralski Silicon Co-implanted with Helium and Hydrogen and Treated at High Temperature and Pressure”, Opto-Electronics Review, vol.12, nr.4, (2004).
  • P10692: A. Mycielski, L. Kowalczyk, A. Szadkowski, B. Chwalisz, A. Wysmolek, R. Stepniewski, J.M. Baranowski, M. Potemski, A. Barcz, B. Witkowska, E. Kaminska: “The Chemical Vapour Transport Growth of ZnO Single Crystals”, Journal of Alloys and Compounds, vol.371, nr.1-2, (2004).
  • P10695: M. Piskorski, A. Piotrowska, T.T. Piotrowski, K. Golaszewska-Malec, E. Papis, J. Katcki, J. Ratajczak, A. Barcz, A. Wawro: “LPE Growth and Characterisation of GaInAsSb Quaternary Layers on (100) GaSb Substrates”, Thin Solid Films, vol.459, nr.1-2, (2004).

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» 2003

  • P10774: I.V. Antonova, A. Misiuk, C.A. Londos, B. Surma, S.A. Smagulova, A. Bukowski, W. Jung, A. Barcz: “Pressure Induced Formation of the Electrically Active Centers in Electron and Neutron Irradiated Silicon”, (2003).
  • P10775: I.V. Antonova, A. Misiuk, C.A. Londos, A. Barcz, E.N. Vandyshev, J. Bak-Misiuk, K.S. Zhuravlev, M. Kaniewska: “Defect-related Diffusion of Hydrogen in Silicon”, Physica B, vol.340-342, (2003).
  • P10777: A. Barcz, M. Zielinski, E. Nossarzewska, G. Lindstroem: “Extremely Deep SIMS Profiling: Oxygen in FZ Silicon”, Applied Surface Science, vol.203-204, (2003).
  • P10779: J. Baszkiewicz, D. Krupa, J.A. Kozubowski, B. Rajchel, M. Mitura, A. Barcz, A. Slosarczyk, Z. Paszkiewicz, Z. Puff: “Influence of the Ca- and P-enriched Oxide Layers Produced on Titanium and the Ti6A14V Alloy by the IBAD Method Upon the Corrosion Resistance of These Materials”, Vacuum, vol.70, nr.2-3, (2003).
  • P10789: A. Czerwinski, E. Simoen, A. Poyal, C. Claeys, H. Ohyama: “Gated-diode Study of Corner and Peripheral Leakage Current in High-energy Neutron Irradiated Silicon p-n Junctions”, IEEE Transactions on Nuclear Science, vol.50, nr.2, (2003).
  • P10790: A. Czerwinski, E. Simoen, A. Poyal, C. Claeys: “Activation Energy Analysis as a Tool for Extraction and Investigation of p-n Junction Leakage Current Components”, Journal of Applied Physics, vol.94, nr.2, (2003).
  • P10818: R. Jakiela, A. Barcz: “Diffusion and Activation of Si Implanted Into GaAs”, Vacuum, vol.70, nr.2-3, (2003).
  • P10820: B. Jaroszewicz, T. Budzynski, A. Panas, A. Kociubinski, W. Slysz, W. Jung, R. Jakiela, A. Barcz, P. Grabiec, J. Marczewski: “High Quality p-n Junction Fabrication by Ion Implantation using LPCVD Amorphous Silicon Films”, Vacuum, vol.70, nr.2-3, (2003).
  • P10822: E. Kaminska, A. Piotrowska, K. Golaszewska-Malec, R. Kruszka, A. Kuchuk, J. Szade, A. Winiarski, A. Barcz, J. Jasinski, Z. Liliental-Weber: “Engineering ZnO/GaN Interfaces for Tunneling Ohmic Contacts to GaN”, (2003).
  • P10846: D. Krupa, J. Baszkiewicz, J.W. Sobczak, A. Bilinski, A. Barcz, B. Rajchel: “Influence of Anodic Oxidation on the Bioactivity and Corrosion Resistance of Phosphorous-ion Implanted Titanium”, Vacuum, vol.70, nr.2-3, (2003).
  • P10847: D. Krupa, J. Baszkiewicz, J.W. Sobczak, A. Bilinski, A. Barcz: “Modifying the Properties of Titanium Surface with the Aim of Improving its Bioactivity and Corrosion Resistance”, Journal of Materials Processing Technology, vol.143-144, (2003).
  • P10879: A. Misiuk, K.S. Zhuravlev, L. Bryja, J. Bak-Misiuk, I.V. Antonova, E.N. Vandyshev, A. Barcz, M. Kaniewska, A. Romano-Rodriguez, C. Kovacsics: “Porous-like Silicon Prepared from Si:H Annealed at High Argon Pressure”, Physica Status Solidi A, vol.197, nr.1, (2003).
  • P10880: A. Misiuk, A. Barcz, J. Ratajczak, L. Bryja: “Effect of High Hydrostatic Pressure During Annealing on Silicon Implanted with Oxygen”, Journal of Materials Science: Materials in Electronics, vol.14, nr.5-7, (2003).
  • P10887: A. Misiuk, J. Ratajczak, B. Surma, A.G. Ulyashin, A. Barcz, W. Jung, A. Wnuk: “The Microstructure and Electrical Properties of Hydrogenated Czochralski Silicon Treated at High Temperature-pressure”, Journal of Physics: Condensed Matterials, vol.15, (2003).
  • P10888: A. Misiuk, J. Ratajczak, A. Barcz, I.V. Antonova, J. Bak-Misiuk: “Effect of Stress on Accumulation of Hydrogen and Microstructure of Silicon Ci-implanted with Hydrogen and Heliuim”, (2003).
  • P10889: A. Misiuk, A. Barcz, J. Ratajczak, J. Bak-Misiuk, I.V. Antonova, V.P. Popov: “Microstructure of Czochralski Silicon Implanted with Deuterium and Annealed under High Pressure”, Physica B, vol.340-342, (2003).
  • P10903: A. Piotrowska, E. Kaminska, A. Barcz, K. Golaszewska-Malec, H. Wrzesinska, T.T. Piotrowski, E. Dynowska, R. Jakiela: “Stable Ohmic Contacts on GaAs and GaN Devices for High Temperatures”, (2003).
  • P10909: K. Piskorski, A. Piotrowska, E. Papis, T.T. Piotrowski, K. Golaszewska-Malec, A. Wawro, J. Adamczewska, A. Barcz, R. Jakiela: “Liquid Phase Epitaxy of (100) Oriented GaInAsSb with High Indium Concentration in Liquid Phase”, (2003).

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» 2002

  • P10999: A. Czerwinski, J. Katcki, J. Ratajczak, E. Simoen, E. Poyai, C. Claeys, H. Ohyama: “ Impact of Fast-neutron Irradiation on the Silicon p-n Junction Leakage and Role of the Diffusion Reverse Current ”, Nuclear Instruments & Methods in Physics Res. B, vol.186, (2002).
  • P11000: A. Czerwinski: “ The Impact of Platelet Oxygen Precipitates in Silicon on the Junction Leakage Current and the Interstitial Oxygen Loss ”, Journal of Physics: Condensed Matterials, vol.14, (2002).
  • P11026: J. Katcki, A. Czerwinski, J. Ratajczak, A. Laszcz: “ Department of Materials and Semiconductor Structures Research ”, Prace ITE, nr.8-12, (2002).
  • P11040: D. Krupa, J. Baszkiewicz, J.A. Kozubowski, A. Barcz, J.W. Sobczak, A. Bilinski, M. Lewandowska-Szumiel, B. Rajchel: “ Effect of Phosphorus-ion Implantation on the Corrosion Resistance and Biocompatibility of Titanium ”, Biomaterials, vol.23, nr.16, (2002).
  • P11077: A. Misiuk, A. Barcz, B. Surma, L. Bryja, J. Ratajczak: “ Effect of High Hydrostatic Pressure Applied During Annealing on Silicon Implanted with Oxygen (SIMOX-like Structures) ”, (2002).
  • P11080: A. Misiuk, J. Bak-Misiuk, A. Barcz, A. Romano-Rodriguez, I.V. Antonova, V.P. Popov, C.A. Londos, J. Jun: “ Effect of Annealing at Argon Pressure up to 1.2 GPa on Hydrogen - Plasma Etched and Hydrogen - Implante Single - Crystalline Silicon ”, (2002).
  • P11134: K. Wieteska, W.K. Wierzchowski, W. Graeff, A. Misiuk, A. Barcz, L. Bryja, V.P. Popov: “ X-Ray Synchrotron Studies of Nanostructure Formation in High Temperature - Pressure Treated Silicon Implanted with Hydrogen ”, Acta Physica Polonica A, vol.102, nr.2, (2002).
  • P11164: E. Kaminska, A. Piotrowska, K. Golaszewska-Malec, A. Barcz, R. Kruszka, T. Ochalski, J. Jasinski, Z. Liliental-Weber: “ Electrical Properties and Microstructure of Transparent ZnO Contacts to GaN ”, Physica Status Solidi C, nr.1, (2002).
  • P11208: A. Czerwinski, E. Simoen, E. Poyai, C. Claeys, H. Ohyama: “P-N Junction Leakage in Neutron-irradiated Diodes Fabricated in Various Silicon Substrates”, Solid State Phenomena, vol.82-84, (2002).

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» 2001

  • P11074: A. Misiuk, A. Barcz, V. Raineri, J. Ratajczak, J. Bak-Misiuk, I.V. Antonova, W.K. Wierzchowski, K. Wieteska: “ Effect of Stress on Accumulation of Oxygen in Silicon Implanted with Helium and Hydrogen ”, Physica B, vol.308-310, (2001).
  • P11207: A. Czerwinski, J. Katcki, E. Poyai, E. Simoen, C. Claeys, J. Ratajczak, E. Gaubas: “Statistical Analysis of Shallow P-N Junction Leakage Increase Using XTEM Results Probabilities”, Materials Science in Semiconductor Processing, vol.4, (2001).
  • P11217: E. Kaminska, A. Piotrowska, A. Barcz, D. Bour, M. Zielinski, J. Jasinski: “Formation of Ohmic Contacts to MOCVD Grown p-GaN by Controlled Activation of Mg”, Materials Science and Engineering B, vol.82, (2001).
  • P11218: E. Kaminska, A. Piotrowska, A. Barcz, K. Reginski, P. Dluzewski, E. Dynowska: “Study of Zn-related Structural Transformations at Zn/Ni/p-GaAs Interfaces Relative to the Formation of an Ohmic Contact”, Materials Science in Semiconductor Processing, vol.4, (2001).
  • P11228: D. Krupa, J. Baszkiewicz, J.A. Kozubowski, A. Barcz, J.W. Sobczak, A. Bilinski, B. Rajchel: “Effect of Calcium-ion Implantation on the Corrosion Resistance and Biocompatibility of Titanium”, Biomaterials, vol.22, nr.15, (2001).
  • P11229: D. Krupa, J. Baszkiewicz, J.A. Kozubowski, A. Barcz, J.W. Sobczak, A. Bilinski, B. Rajchel: “The Influence of Calcium and/or Phosphorus Ion Implantation on the Structure and Corrosion Resistance of Titanium”, Vacuum, vol.63, nr.4, (2001).
  • P11239: A. Misiuk, J. Bak-Misiuk, A. Barcz, A. Romano-Rodriguez, I.V. Antonova, V.P. Popov, J. Jun, C.A. Londos: “Effect of Annealing at Argon Pressure up to 1.2 GPa on Hydrogen-plasma-etched and Hydrogen-implanted Single-crystalline Silicon”, International Journal of Hydrogen Energy, vol.26, nr.5, (2001).
  • P11242: A. Misiuk, A. Barcz, J. Ratajczak, J. Katcki, J. Bak-Misiuk, L. Bryja, B. Surma, G. Gawlik: “Structure of Oxygen-implanted Silicon Single Crystals Treated at >1400 K under High Argon Pressure”, Crystal Research and Technology, vol.36, nr.8-10, (2001).
  • P11243: A. Misiuk, A. Barcz, J. Ratajczak, I.V. Antonova, J. Jun: “Hydrostatic Pressure Effect on Redistribution of Oxygen Atoms in Oxygen-implanted Silicon”, Solid State Phenomena, vol.82-84, (2001).
  • P11256: M. Piskorski, E. Papis, K. Golaszewska-Malec, T.T. Piotrowski, A. Piotrowska, A. Barcz, M. Zielinski, J. Adamczewska, M. Sawicki: “Wzrost epitaksjalny i właściwości warstw poczwórnych na bazie GaSb”, Elektronika, nr.8-9, (2001).
  • P11259: E. Poyai, E. Simoen, C. Claeys, A. Czerwinski, E. Gaubas: “Improved Extraction of the Activation Energy of the Leakage Current in Silicon p-n Junction Diodes”, Applied Physics Letters, vol.78, nr.14, (2001).
  • P11265: E. Simoen, A. Poyai, V. Claeys, N. Lukyanchikova, N. Garbar, A. Czerwinski, J. Katcki, J. Ratajczak, E. Gaubas: “Electrical Characterization of Shallow Cobalt-solicited Junctions”, Journal of Materials Science: Materials in Electronics, vol.12, nr.4-6, (2001).

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» 2000

  • P11283: A. Misiuk, A. Barcz, J. Ratajczak, M. Lopez, A. Romano-Rodriguez, J. Bak-Misiuk, B. Surma, J. Jun, I.V. Antonova, V.P. Popov: “ Effect of External Stress on Creation of Buried SiO2 Layer in Silicon Implanted with Oxygen”, Materials Science and Engineering B, vol.73, (2000).
  • P11289: A. Poyai, E. Simoen, C. Claeys, A. Czerwinski: “ Silicon Substrate Effects on the Current-Voltage Characteristics of Advanced p-n Junction Diodes.”, Materials Science and Engineering B, vol.73, (2000).
  • P11297: A. Seweryn, T. Wojtowicz, G. Karczewski, A. Barcz, R. Jakiela: “ Cation Diffusion in MBE-grown CdTe Layers.”, Thin Solid Films, vol.367, (2000).
  • P11299: A. Czerwinski, J. Katcki, E. Poyai, E. Simoen, C. Claeys, J. Ratajczak, E. Gaubas: “ Statistical Analysis of Shallow P=N Junction Leakage Increase Using XTEM Results Probabilities.”, Materials Science in Semiconductor Processing, vol.4, nr.1-3, (2000).
  • P11313: A. Misiuk, B. Surma, J. Bak-Misiuk, A. Romano-Rodriguez, A. Wnuk, A. Brzozowski, A. Bachrouri, A. Barcz: “Photoluminescence of Porous Silicon Prepared from Pressure Treated Cz-Si”, Physica Status Solidi A, vol.182, nr.1, (2000).
  • P11315: J. Baszkiewicz, P. Kaminski, J.A. Kozubowski, D. Krupa, K. Gosiewska, A. Barcz, G. Gawlik, J. Jagielski: “ Implantation of Silicon Ions Into a Surface Layer of the Ti6A14V Titanium Alloy and its Effect Upon the Corrosion Resistance and Structure of this Layer”, Journal of Materials Science: Materials in Electronics, vol.35, nr.3, (2000).
  • P11316: A. Czerwinski, E. Simoen, A. Poyai, C. Claeys: “ Peripheral Current Analysis of Silicon p-n Junction and Gated Diodes”, Journal of Applied Physics, vol.88, nr.11, (2000).
  • P11317: E. Kaminska, A. Piotrowska, A. Barcz, D. Bour, M. Zielinski, J. Jasinski: “ Formation of Ohmic Contacts to MOCVD Grown p-GaN by Controlled”, Materials Science and Engineering B, vol.56, (2000).

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» 1999

  • P11327: C. Claeys, A. Poyai, E. Simoen, A. Czerwinski, J. Katcki: “P-N Junction Diagnostics to Determine Surface and Bulk Generation/ Recombination Properties of Silicon Substrates”, Journal of the Electrochemical Society, vol.146, nr.3, (1999).
  • P11328: C. Claeys, E. Simoen, A. Poyai, A. Czerwinski: “Electrical Quality Assessment of Epitaxial Wafers Based on p-n Junction Diagnostics”, Journal of the Electrochemical Society, vol.146, nr.9, (1999).
  • P11329: A. Czerwinski, E. Simoen, A. Poyai, C. Claeys: “P-N Junction Peripheral Current Analysis using Gated Diode Measurements”, Solid State Phenomena, vol.69-70, (1999).
  • P11350: D. Krupa, E. Jezierska, J. Baszkiewicz, T. Wierzchon, A. Barcz, G. Gawlik, J. Jagielski, J.W. Sobczak, B. Larisch: “Effect of Carbon Ion Implantation on the Structure and Corrosion Resistance of OT-4-0 Titanium Alloy”, Surface & Coatings Technology, vol.114, (1999).
  • P11351: D. Krupa, J. Baszkiewicz, E. Jezierska, J. Mizera, T. Wierzchon, A. Barcz, R. Fillit: “Effect of Nitrogen-ion Implantation on the Corrosion Resistance of OT-4-0 Titanium Alloy in 0.9% NaCl Environment”, Surface & Coatings Technology, vol.111, nr.1, (1999).
  • P11352: D. Krupa, J. Baszkiewicz, E. Jezierska, J.A. Kozubowski, A. Barcz: “Effect of Nitrogen, Carbon and Oxygen Ion Implantation on the Structure and Corrosion Resistance of OT-4-0 Titanium Alloy”, Nukleonika, vol.44, nr.2, (1999).
  • P11358: A. Misiuk, B. Surma, I.V. Antonova, V.P. Popov, J. Bak-Misiuk, M. Lopez, A. Romano-Rodriguez, A. Barcz, J. Jun: “Effect of External Stress Applied during Annealing on Hydrogen- and Oxygen-implanted Silicon”, Solid State Phenomena, vol.69-70, (1999).

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» 1998

  • P11323: J. Baszkiewicz, J.A. Kozubowski, D. Krupa, A. Barcz, G. Gawlik, J. Jagielski: “Effect of Silicon-ion Implantation Upon the Corrosion Properties of Austenitic Stainless Steels”, Journal of Materials Science: Materials in Electronics, vol.33, nr.18, (1998).
  • P11377: A. Barcz, T. Karczewski, T. Wojtowicz, M. Sadło, J. kossut: “Channels of Cd Diffusion and Stoichiometry in CdTe Grown by Molecular Beam Epitaxy”, Applied Physics Letters, vol.72, nr.2, (1998).
  • P11384: A. Czerwinski, E. Simoen, C. Claeys, K. Klima, D. Tomaszewski, J. Gibki, J. Katcki: “Optimised Diode Analysis of Electrical Silicon Substrate Properties”, Journal of the Electrochemical Society, vol.145, nr.6, (1998).
  • P11385: A. Czerwinski, E. Simoen, C. Claeys: “P-N Junction Peripheral Current Analysis Using Gated Diode Measurements”, Applied Physics Letters, vol.72, nr.26, (1998).
  • P11386: A. Czerwinski, J. Ratajczak, J. Katcki, A. Bakowski, M. Bakowski: “Electrical and Transmission Electron Microscopy Characterization of 4H-SC Homoepitaxial Mesa Diodes”, Materials Science Forum, vol.264-268, (1998).
  • P11394: E. Kaminska, A. Piotrowska, J. Jasinski, J.A. Kozubowski, A. Barcz, K. Golaszewska-Malec, M.D. Bremser, R.F. Davis: “Interfacial Microstructure of Ni/Si-Based Ohmic Contacts to GaN”, Acta Physica Polonica A, vol.94, nr.3, (1998).
  • P11411: E. Simoen, C. Claeys, A. Czerwinski, J. Katcki: “Accurate Extraction of the Diffusion Current in Silicon p-n Function Diodes”, Applied Physics Letters, vol.72, nr.9, (1998).

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