Measurements, characterization

SEM

Examples of our SEM applications
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Design of automated measurement system dedicated to NI LabVIEW environment

This offer covers design of fully automated measurement system basing on remotely controlled test equipment and additionally developed hardware.
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The offer of high tech services complex electrical sample analysis

1. Nanoelectronic device interface traps and surface properties mapping
2. Identification of the electrical equivalent circuit of the nanostructure and interfaces by means of admittance spectroscopy
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The offer of high tech services complex optical and photoelectric sample analysis

1. Ellipsometric characterization of samples in the vacuum UV range
2. Determination of MIS systems band diagrams using unique photoelectric methods
3. Determination of nanostructures chemical composition, temperature, stress, etc.
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TEM

Examples of our TEM investigations
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Optical measurements laboratory

The laboratory performs investigations which rely on the methods of spectroscopic ellipsometry, interferometry, reflectometry and Raman spectroscopy. These methods are used, among others, to determine the thickness and optical characteristics of...
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Electrical and photoelectric measurements laboratory

The laboratory performs measurements of the C(VG), I(VG) and G(VG) characteristics of semiconductor structures with ultimate sensitivity and resolution of 0.1 fA / 0.5 μV. This is primarily done using the Agilent B1500A semiconductor device...
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