Design of automated measurement system dedicated to NI LabVIEW environment
This offer covers design of fully automated measurement system basing on remotely controlled test equipment and additionally developed hardware.
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The offer of high tech services complex electrical sample analysis
1. Nanoelectronic device interface traps and surface properties mapping
2. Identification of the electrical equivalent circuit of the nanostructure and interfaces by means of admittance spectroscopy
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2. Identification of the electrical equivalent circuit of the nanostructure and interfaces by means of admittance spectroscopy
The offer of high tech services complex optical and photoelectric sample analysis
1. Ellipsometric characterization of samples in the vacuum UV range
2. Determination of MIS systems band diagrams using unique photoelectric methods
3. Determination of nanostructures chemical composition, temperature, stress, etc.
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2. Determination of MIS systems band diagrams using unique photoelectric methods
3. Determination of nanostructures chemical composition, temperature, stress, etc.
